High cumulants in the counting statistics measured for a quantum dot

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Original languageEnglish
Pages (from-to)848-851
Number of pages4
JournalPhysica E: Low-Dimensional Systems and Nanostructures
Volume42
Issue number4
Publication statusPublished - 5 Dec 2009

Abstract

We report on measurements of single electron tunneling through a quantum dot using a quantum point contact as non-invasive charge detector with fast time response. We elaborate on the unambiguous identification of individual tunneling events and determine the distribution of transferred charges, the so-called full counting statistics. We discuss our data analysis, including the error estimates of the measurement, and show that the quality of our experimental results is sufficiently high to extract cumulants of the distribution up to the 20th order for short times.

Keywords

    Cumulants, Full counting statistics, Quantum dot, Single electron tunneling

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Cite this

High cumulants in the counting statistics measured for a quantum dot. / Fricke, Christian; Hohls, Frank; Flindt, Christian et al.
In: Physica E: Low-Dimensional Systems and Nanostructures, Vol. 42, No. 4, 05.12.2009, p. 848-851.

Research output: Contribution to journalArticleResearchpeer review

Fricke C, Hohls F, Flindt C, Haug RJ. High cumulants in the counting statistics measured for a quantum dot. Physica E: Low-Dimensional Systems and Nanostructures. 2009 Dec 5;42(4):848-851. doi: 10.1016/j.physe.2009.11.112
Fricke, Christian ; Hohls, Frank ; Flindt, Christian et al. / High cumulants in the counting statistics measured for a quantum dot. In: Physica E: Low-Dimensional Systems and Nanostructures. 2009 ; Vol. 42, No. 4. pp. 848-851.
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