Details
Original language | English |
---|---|
Pages (from-to) | 848-851 |
Number of pages | 4 |
Journal | Physica E: Low-Dimensional Systems and Nanostructures |
Volume | 42 |
Issue number | 4 |
Publication status | Published - 5 Dec 2009 |
Abstract
We report on measurements of single electron tunneling through a quantum dot using a quantum point contact as non-invasive charge detector with fast time response. We elaborate on the unambiguous identification of individual tunneling events and determine the distribution of transferred charges, the so-called full counting statistics. We discuss our data analysis, including the error estimates of the measurement, and show that the quality of our experimental results is sufficiently high to extract cumulants of the distribution up to the 20th order for short times.
Keywords
- Cumulants, Full counting statistics, Quantum dot, Single electron tunneling
ASJC Scopus subject areas
- Materials Science(all)
- Electronic, Optical and Magnetic Materials
- Physics and Astronomy(all)
- Atomic and Molecular Physics, and Optics
- Physics and Astronomy(all)
- Condensed Matter Physics
Cite this
- Standard
- Harvard
- Apa
- Vancouver
- BibTeX
- RIS
In: Physica E: Low-Dimensional Systems and Nanostructures, Vol. 42, No. 4, 05.12.2009, p. 848-851.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - High cumulants in the counting statistics measured for a quantum dot
AU - Fricke, Christian
AU - Hohls, Frank
AU - Flindt, Christian
AU - Haug, Rolf J.
PY - 2009/12/5
Y1 - 2009/12/5
N2 - We report on measurements of single electron tunneling through a quantum dot using a quantum point contact as non-invasive charge detector with fast time response. We elaborate on the unambiguous identification of individual tunneling events and determine the distribution of transferred charges, the so-called full counting statistics. We discuss our data analysis, including the error estimates of the measurement, and show that the quality of our experimental results is sufficiently high to extract cumulants of the distribution up to the 20th order for short times.
AB - We report on measurements of single electron tunneling through a quantum dot using a quantum point contact as non-invasive charge detector with fast time response. We elaborate on the unambiguous identification of individual tunneling events and determine the distribution of transferred charges, the so-called full counting statistics. We discuss our data analysis, including the error estimates of the measurement, and show that the quality of our experimental results is sufficiently high to extract cumulants of the distribution up to the 20th order for short times.
KW - Cumulants
KW - Full counting statistics
KW - Quantum dot
KW - Single electron tunneling
UR - http://www.scopus.com/inward/record.url?scp=76949106372&partnerID=8YFLogxK
U2 - 10.1016/j.physe.2009.11.112
DO - 10.1016/j.physe.2009.11.112
M3 - Article
AN - SCOPUS:76949106372
VL - 42
SP - 848
EP - 851
JO - Physica E: Low-Dimensional Systems and Nanostructures
JF - Physica E: Low-Dimensional Systems and Nanostructures
SN - 1386-9477
IS - 4
ER -