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Hanle Effect for Lifetime Determinations in the Soft X-Ray Regime

Research output: Contribution to journalArticleResearchpeer review

Authors

  • Moto Togawa
  • Jan Richter
  • Chintan Shah
  • Marc Botz

Research Organisations

External Research Organisations

  • Max Planck Institute for Nuclear Physics
  • European X-Ray Free-Electron Laser Facility GmbH (XFEL)
  • Heidelberg University
  • Physikalisch-Technische Bundesanstalt PTB
  • NASA Goddard Space Flight Center (NASA-GSFC)
  • Johns Hopkins University
  • NOVA University Lisbon
  • National Research Council Italy (CNR)
  • University of Camerino
  • Japan Aerospace Exploration Agency
  • Sincrotrone Trieste
  • CNR Istituto Officina Dei Materiali (IOM)
  • Helmholtz Institute Jena
  • GSI Helmholtz Centre for Heavy Ion Research
  • Friedrich Schiller University Jena
  • Technische Universität Braunschweig

Details

Original languageEnglish
Article number163202
Number of pages7
JournalPhysical review letters
Volume133
Issue number16
Publication statusPublished - 16 Oct 2024

Abstract

By exciting a series of 1s2 S01→1snpP11 transitions in heliumlike nitrogen ions with linearly polarized monochromatic soft x rays at the Elettra facility, we found a change in the angular distribution of the fluorescence sensitive to the principal quantum number n. In particular it is observed that the ratio of emission in directions parallel and perpendicular to the polarization of incident radiation increases with higher n. We find this n dependence to be a manifestation of the Hanle effect, which served as a practical tool for lifetime determinations of optical transitions since its discovery in 1924. In contrast to traditional Hanle effect experiments, in which one varies the magnetic field and considers a particular excited state, we demonstrate a "soft x-ray Hanle effect"which arises in a static magnetic field but for a series of excited states. By comparing experimental data with theoretical predictions, we were able to determine lifetimes ranging from hundreds of femtoseconds to tens of picoseconds of the 1snpP11 levels, which find excellent agreement with atomic-structure calculations. We argue that dedicated soft x-ray measurements could yield lifetime data that are beyond current experimental reach and cannot yet be predicted with sufficient accuracy.

ASJC Scopus subject areas

Cite this

Hanle Effect for Lifetime Determinations in the Soft X-Ray Regime. / Togawa, Moto; Richter, Jan; Shah, Chintan et al.
In: Physical review letters, Vol. 133, No. 16, 163202, 16.10.2024.

Research output: Contribution to journalArticleResearchpeer review

Togawa, M, Richter, J, Shah, C, Botz, M, Nenninger, J, Danisch, J, Goes, J, Kühn, S, Amaro, P, Mohamed, A, Amano, Y, Orlando, S, Totani, R, De Simone, M, Fritzsche, S, Pfeifer, T, Coreno, M, Surzhykov, A & López-Urrutia, JRC 2024, 'Hanle Effect for Lifetime Determinations in the Soft X-Ray Regime', Physical review letters, vol. 133, no. 16, 163202. https://doi.org/10.1103/PhysRevLett.133.163202
Togawa, M., Richter, J., Shah, C., Botz, M., Nenninger, J., Danisch, J., Goes, J., Kühn, S., Amaro, P., Mohamed, A., Amano, Y., Orlando, S., Totani, R., De Simone, M., Fritzsche, S., Pfeifer, T., Coreno, M., Surzhykov, A., & López-Urrutia, J. R. C. (2024). Hanle Effect for Lifetime Determinations in the Soft X-Ray Regime. Physical review letters, 133(16), Article 163202. https://doi.org/10.1103/PhysRevLett.133.163202
Togawa M, Richter J, Shah C, Botz M, Nenninger J, Danisch J et al. Hanle Effect for Lifetime Determinations in the Soft X-Ray Regime. Physical review letters. 2024 Oct 16;133(16):163202. doi: 10.1103/PhysRevLett.133.163202
Togawa, Moto ; Richter, Jan ; Shah, Chintan et al. / Hanle Effect for Lifetime Determinations in the Soft X-Ray Regime. In: Physical review letters. 2024 ; Vol. 133, No. 16.
Download
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AU - Togawa, Moto

AU - Richter, Jan

AU - Shah, Chintan

AU - Botz, Marc

AU - Nenninger, Joshua

AU - Danisch, Jonas

AU - Goes, Joschka

AU - Kühn, Steffen

AU - Amaro, Pedro

AU - Mohamed, Awad

AU - Amano, Yuki

AU - Orlando, Stefano

AU - Totani, Roberta

AU - De Simone, Monica

AU - Fritzsche, Stephan

AU - Pfeifer, Thomas

AU - Coreno, Marcello

AU - Surzhykov, Andrey

AU - López-Urrutia, José R.Crespo

N1 - Publisher Copyright: © 2024 authors. Published by the American Physical Society. Published by the American Physical Society under the terms of the "https://creativecommons.org/licenses/by/4.0/"Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI. Open access publication funded by the Max Planck Society.

PY - 2024/10/16

Y1 - 2024/10/16

N2 - By exciting a series of 1s2 S01→1snpP11 transitions in heliumlike nitrogen ions with linearly polarized monochromatic soft x rays at the Elettra facility, we found a change in the angular distribution of the fluorescence sensitive to the principal quantum number n. In particular it is observed that the ratio of emission in directions parallel and perpendicular to the polarization of incident radiation increases with higher n. We find this n dependence to be a manifestation of the Hanle effect, which served as a practical tool for lifetime determinations of optical transitions since its discovery in 1924. In contrast to traditional Hanle effect experiments, in which one varies the magnetic field and considers a particular excited state, we demonstrate a "soft x-ray Hanle effect"which arises in a static magnetic field but for a series of excited states. By comparing experimental data with theoretical predictions, we were able to determine lifetimes ranging from hundreds of femtoseconds to tens of picoseconds of the 1snpP11 levels, which find excellent agreement with atomic-structure calculations. We argue that dedicated soft x-ray measurements could yield lifetime data that are beyond current experimental reach and cannot yet be predicted with sufficient accuracy.

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