Details
Original language | English |
---|---|
Pages (from-to) | 229-234 |
Number of pages | 6 |
Journal | Journal of crystal growth |
Volume | 235 |
Issue number | 1-4 |
Early online date | 6 Nov 2001 |
Publication status | Published - Feb 2002 |
Externally published | Yes |
Abstract
We present the results for crystalline growth of praseodymium oxide on Si as a potential high-K dielectric with promising electrical properties. All layer growth experiments were performed using solid source molecular beam epitaxy. The initial stages of growth were studied by scanning tunneling microscopy. On Si(0 0 1) surfaces, crystalline Pr2O3 grows as (1 1 0)-domains, with two orthogonal in-plane orientations. Epitaxial silicon overgrowth seems to be impossible. We obtain perfect epitaxial growth on Si(1 1 1). These layers can also be overgrown epitaxially with silicon.
Keywords
- A3. Molecular beam epitaxy, B1. Oxides, B1. Rare earth compounds, B2. Dielectric materials
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Condensed Matter Physics
- Chemistry(all)
- Inorganic Chemistry
- Materials Science(all)
- Materials Chemistry
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In: Journal of crystal growth, Vol. 235, No. 1-4, 02.2002, p. 229-234.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - Growth of crystalline praseodymium oxide on silicon
AU - Osten, H. J.
AU - Liu, J. P.
AU - Bugiel, E.
AU - Muüssig, H. J.
AU - Zaumseil, P.
PY - 2002/2
Y1 - 2002/2
N2 - We present the results for crystalline growth of praseodymium oxide on Si as a potential high-K dielectric with promising electrical properties. All layer growth experiments were performed using solid source molecular beam epitaxy. The initial stages of growth were studied by scanning tunneling microscopy. On Si(0 0 1) surfaces, crystalline Pr2O3 grows as (1 1 0)-domains, with two orthogonal in-plane orientations. Epitaxial silicon overgrowth seems to be impossible. We obtain perfect epitaxial growth on Si(1 1 1). These layers can also be overgrown epitaxially with silicon.
AB - We present the results for crystalline growth of praseodymium oxide on Si as a potential high-K dielectric with promising electrical properties. All layer growth experiments were performed using solid source molecular beam epitaxy. The initial stages of growth were studied by scanning tunneling microscopy. On Si(0 0 1) surfaces, crystalline Pr2O3 grows as (1 1 0)-domains, with two orthogonal in-plane orientations. Epitaxial silicon overgrowth seems to be impossible. We obtain perfect epitaxial growth on Si(1 1 1). These layers can also be overgrown epitaxially with silicon.
KW - A3. Molecular beam epitaxy
KW - B1. Oxides
KW - B1. Rare earth compounds
KW - B2. Dielectric materials
UR - http://www.scopus.com/inward/record.url?scp=0036467104&partnerID=8YFLogxK
U2 - 10.1016/S0022-0248(01)01777-8
DO - 10.1016/S0022-0248(01)01777-8
M3 - Article
AN - SCOPUS:0036467104
VL - 235
SP - 229
EP - 234
JO - Journal of crystal growth
JF - Journal of crystal growth
SN - 0022-0248
IS - 1-4
ER -