Details
| Original language | English |
|---|---|
| Pages (from-to) | 3440-3442 |
| Number of pages | 3 |
| Journal | Applied physics letters |
| Volume | 64 |
| Issue number | 25 |
| Publication status | Published - 20 Jun 1994 |
| Externally published | Yes |
Abstract
Si1-x-yGexCy layers have been grown on Si(001) substrates with molecular beam epitaxy and investigated with transmission electron microscopy and x-ray diffraction. We show that it is possible to adjust the strain in pseudomorphic SiGe layers by adding small amounts of carbon. A simple linear extrapolation between the different lattice constants opens the possibility to predict the SiGeC structure in dependence on the carbon content. It is possible to grown epitaxial SiGeC layers with up to 2% carbon. Larger carbon concentrations lead to a crystallographic degradation of the layers. We were able to grow the first pseudomorphic SiGeC layer on Si(001) that is under tensile stress. These layers exhibit a lattice plane spacing in growth direction smaller than that of silicon.
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Physics and Astronomy (miscellaneous)
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In: Applied physics letters, Vol. 64, No. 25, 20.06.1994, p. 3440-3442.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - Growth of an inverse tetragonal distorted SiGe layer on Si(001) by adding small amounts of carbon
AU - Osten, H. J.
AU - Bugiel, E.
AU - Zaumseil, P.
PY - 1994/6/20
Y1 - 1994/6/20
N2 - Si1-x-yGexCy layers have been grown on Si(001) substrates with molecular beam epitaxy and investigated with transmission electron microscopy and x-ray diffraction. We show that it is possible to adjust the strain in pseudomorphic SiGe layers by adding small amounts of carbon. A simple linear extrapolation between the different lattice constants opens the possibility to predict the SiGeC structure in dependence on the carbon content. It is possible to grown epitaxial SiGeC layers with up to 2% carbon. Larger carbon concentrations lead to a crystallographic degradation of the layers. We were able to grow the first pseudomorphic SiGeC layer on Si(001) that is under tensile stress. These layers exhibit a lattice plane spacing in growth direction smaller than that of silicon.
AB - Si1-x-yGexCy layers have been grown on Si(001) substrates with molecular beam epitaxy and investigated with transmission electron microscopy and x-ray diffraction. We show that it is possible to adjust the strain in pseudomorphic SiGe layers by adding small amounts of carbon. A simple linear extrapolation between the different lattice constants opens the possibility to predict the SiGeC structure in dependence on the carbon content. It is possible to grown epitaxial SiGeC layers with up to 2% carbon. Larger carbon concentrations lead to a crystallographic degradation of the layers. We were able to grow the first pseudomorphic SiGeC layer on Si(001) that is under tensile stress. These layers exhibit a lattice plane spacing in growth direction smaller than that of silicon.
UR - http://www.scopus.com/inward/record.url?scp=0001016408&partnerID=8YFLogxK
U2 - 10.1063/1.111235
DO - 10.1063/1.111235
M3 - Article
AN - SCOPUS:0001016408
VL - 64
SP - 3440
EP - 3442
JO - Applied physics letters
JF - Applied physics letters
SN - 0003-6951
IS - 25
ER -