Frequency-to-Time Mapping Technique for Direct Spectral Characterization of Biphoton States From Pulsed Spontaneous Parametric Processes

Research output: Contribution to journalArticleResearchpeer review

Authors

  • Anahita Khodadad Kashi
  • Lynn Sader
  • Raktim Haldar
  • Benjamin Wetzel
  • Michael Kues
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Original languageEnglish
Article number834065
JournalFrontiers in Photonics
Volume3
Publication statusPublished - 2 Mar 2022

Abstract

The well-established frequency-to-time mapping technique is employed as a convenient and time-efficient method to directly characterize the spectral correlations of biphoton states from a pulsed-excited spontaneous parametric down-conversion process. We were enabled by this technique to implement for the first time, the spectral Hanbury-Brown and Twiss measurement, revealing directly the single frequency-mode bandwidth of the biphoton state.

Keywords

    coincidence to accidental ratio, dispersive fourier transform, frequency-to-time mapping, Hanbury Brown and Twiss measurement, joint spectral intensity, spontaneous parametric processes

ASJC Scopus subject areas

Cite this

Frequency-to-Time Mapping Technique for Direct Spectral Characterization of Biphoton States From Pulsed Spontaneous Parametric Processes. / Khodadad Kashi, Anahita; Sader, Lynn; Haldar, Raktim et al.
In: Frontiers in Photonics, Vol. 3, 834065, 02.03.2022.

Research output: Contribution to journalArticleResearchpeer review

Khodadad Kashi A, Sader L, Haldar R, Wetzel B, Kues M. Frequency-to-Time Mapping Technique for Direct Spectral Characterization of Biphoton States From Pulsed Spontaneous Parametric Processes. Frontiers in Photonics. 2022 Mar 2;3:834065. doi: 10.3389/fphot.2022.834065
Khodadad Kashi, Anahita ; Sader, Lynn ; Haldar, Raktim et al. / Frequency-to-Time Mapping Technique for Direct Spectral Characterization of Biphoton States From Pulsed Spontaneous Parametric Processes. In: Frontiers in Photonics. 2022 ; Vol. 3.
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