Frequency dependence of dielectrophoretic fabrication of single-walled carbon nanotube field-effect transistors

Research output: Contribution to journalArticleResearchpeer review

Authors

  • Yousef Adeli Sadabad
  • Amirreza Khodadadian
  • Kiarash Hosseini Istadeh
  • Marjan Hedayati
  • Reza Kalantarinejad
  • Clemens Heitzinger

Research Organisations

External Research Organisations

  • Shezan Research and Innovation Center
  • TU Wien (TUW)
  • Arizona State University
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Details

Original languageEnglish
Pages (from-to)1516-1526
Number of pages11
JournalJournal of Computational Electronics
Volume19
Issue number4
Early online date10 Aug 2020
Publication statusPublished - Dec 2020

Abstract

A new theoretical model for the dielectrophoretic (DEP) fabrication of single-walled carbon nanotubes (SWCNTs) is presented. A different frequency interval for the alignment of wide-energy-gap semiconductor SWCNTs is obtained, exhibiting a considerable difference from the prevalent model. Two specific models are study, namely the spherical model and the ellipsoid model, to estimate the frequency interval. Then, the DEP process is performed and the obtained frequencies (from the spherical and ellipsoid models) are used to align the SWCNTs. These empirical results confirm the theoretical predictions, representing a crucial step towards the realization of carbon nanotube field-effect transistors (CNT-FETs) via the DEP process based on the ellipsoid model.

Keywords

    Dielectrophoresis, Ellipsoid model, Single-walled carbon nanotube, Spherical model

ASJC Scopus subject areas

Cite this

Frequency dependence of dielectrophoretic fabrication of single-walled carbon nanotube field-effect transistors. / Sadabad, Yousef Adeli; Khodadadian, Amirreza; Istadeh, Kiarash Hosseini et al.
In: Journal of Computational Electronics, Vol. 19, No. 4, 12.2020, p. 1516-1526.

Research output: Contribution to journalArticleResearchpeer review

Sadabad YA, Khodadadian A, Istadeh KH, Hedayati M, Kalantarinejad R, Heitzinger C. Frequency dependence of dielectrophoretic fabrication of single-walled carbon nanotube field-effect transistors. Journal of Computational Electronics. 2020 Dec;19(4):1516-1526. Epub 2020 Aug 10. doi: 10.1007/s10825-020-01562-x, 10.15488/12613
Sadabad, Yousef Adeli ; Khodadadian, Amirreza ; Istadeh, Kiarash Hosseini et al. / Frequency dependence of dielectrophoretic fabrication of single-walled carbon nanotube field-effect transistors. In: Journal of Computational Electronics. 2020 ; Vol. 19, No. 4. pp. 1516-1526.
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title = "Frequency dependence of dielectrophoretic fabrication of single-walled carbon nanotube field-effect transistors",
abstract = "A new theoretical model for the dielectrophoretic (DEP) fabrication of single-walled carbon nanotubes (SWCNTs) is presented. A different frequency interval for the alignment of wide-energy-gap semiconductor SWCNTs is obtained, exhibiting a considerable difference from the prevalent model. Two specific models are study, namely the spherical model and the ellipsoid model, to estimate the frequency interval. Then, the DEP process is performed and the obtained frequencies (from the spherical and ellipsoid models) are used to align the SWCNTs. These empirical results confirm the theoretical predictions, representing a crucial step towards the realization of carbon nanotube field-effect transistors (CNT-FETs) via the DEP process based on the ellipsoid model.",
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T1 - Frequency dependence of dielectrophoretic fabrication of single-walled carbon nanotube field-effect transistors

AU - Sadabad, Yousef Adeli

AU - Khodadadian, Amirreza

AU - Istadeh, Kiarash Hosseini

AU - Hedayati, Marjan

AU - Kalantarinejad, Reza

AU - Heitzinger, Clemens

N1 - Funding Information: Open access funding provided by Austrian Science Fund (FWF). A.K. and C.H. acknowledge financial support given by the FWF (Austrian Science Fund) START Project No. Y660 (PDE Models for Nanotechnology).

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AB - A new theoretical model for the dielectrophoretic (DEP) fabrication of single-walled carbon nanotubes (SWCNTs) is presented. A different frequency interval for the alignment of wide-energy-gap semiconductor SWCNTs is obtained, exhibiting a considerable difference from the prevalent model. Two specific models are study, namely the spherical model and the ellipsoid model, to estimate the frequency interval. Then, the DEP process is performed and the obtained frequencies (from the spherical and ellipsoid models) are used to align the SWCNTs. These empirical results confirm the theoretical predictions, representing a crucial step towards the realization of carbon nanotube field-effect transistors (CNT-FETs) via the DEP process based on the ellipsoid model.

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