Fractal Charge Carrier Kinetics in TiO2

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Authors

  • F. Sieland
  • J. Schneider
  • D.W. Bahnemann

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Original languageEnglish
Pages (from-to)24282–24291
Number of pages10
JournalJournal of Physical Chemistry C
Volume121
Issue number43
Early online date24 Oct 2017
Publication statusPublished - 2 Nov 2017

Abstract

Charge carrier recombination kinetics of TiO 2 powder samples were analyzed in the time domain ranging from 50 ns to 1 ms. The transient reflectance signals of the charge carriers observed by laser flash photolysis spectroscopy do not fit to simple second order kinetics as expected for the recombination of trapped electrons and holes. The deviation from second order reaction dynamics could rather be explained by the segregation of charge carriers and the fractal dimension of the semiconductor agglomerates. According to the fractal reaction kinetics, the time dependent rate coefficient k f (k f = k 2,ft -h) has been employed instead of the second order rate constant k 2, where the fractal parameter h describes the dimension of the system. This model could successfully be used to describe charge carrier signals in all observed time domains. Moreover, the model was compared with the concept developed by Shuttle et al., which proposes that the charge carrier signals decay following a power-law. The benefits of the fractal model proposed here include the possibility to describe and analyze influences of the morphology on the fractal parameter h and its applicability over a broad range of time domains and excitation energies.

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Cite this

Fractal Charge Carrier Kinetics in TiO2. / Sieland, F.; Schneider, J.; Bahnemann, D.W.
In: Journal of Physical Chemistry C, Vol. 121, No. 43, 02.11.2017, p. 24282–24291.

Research output: Contribution to journalArticleResearchpeer review

Sieland, F, Schneider, J & Bahnemann, DW 2017, 'Fractal Charge Carrier Kinetics in TiO2', Journal of Physical Chemistry C, vol. 121, no. 43, pp. 24282–24291. https://doi.org/10.1021/acs.jpcc.7b07087
Sieland, F., Schneider, J., & Bahnemann, D. W. (2017). Fractal Charge Carrier Kinetics in TiO2. Journal of Physical Chemistry C, 121(43), 24282–24291. https://doi.org/10.1021/acs.jpcc.7b07087
Sieland F, Schneider J, Bahnemann DW. Fractal Charge Carrier Kinetics in TiO2. Journal of Physical Chemistry C. 2017 Nov 2;121(43):24282–24291. Epub 2017 Oct 24. doi: 10.1021/acs.jpcc.7b07087
Sieland, F. ; Schneider, J. ; Bahnemann, D.W. / Fractal Charge Carrier Kinetics in TiO2. In: Journal of Physical Chemistry C. 2017 ; Vol. 121, No. 43. pp. 24282–24291.
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abstract = "Charge carrier recombination kinetics of TiO 2 powder samples were analyzed in the time domain ranging from 50 ns to 1 ms. The transient reflectance signals of the charge carriers observed by laser flash photolysis spectroscopy do not fit to simple second order kinetics as expected for the recombination of trapped electrons and holes. The deviation from second order reaction dynamics could rather be explained by the segregation of charge carriers and the fractal dimension of the semiconductor agglomerates. According to the fractal reaction kinetics, the time dependent rate coefficient k f (k f = k 2,ft -h) has been employed instead of the second order rate constant k 2, where the fractal parameter h describes the dimension of the system. This model could successfully be used to describe charge carrier signals in all observed time domains. Moreover, the model was compared with the concept developed by Shuttle et al., which proposes that the charge carrier signals decay following a power-law. The benefits of the fractal model proposed here include the possibility to describe and analyze influences of the morphology on the fractal parameter h and its applicability over a broad range of time domains and excitation energies. ",
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N2 - Charge carrier recombination kinetics of TiO 2 powder samples were analyzed in the time domain ranging from 50 ns to 1 ms. The transient reflectance signals of the charge carriers observed by laser flash photolysis spectroscopy do not fit to simple second order kinetics as expected for the recombination of trapped electrons and holes. The deviation from second order reaction dynamics could rather be explained by the segregation of charge carriers and the fractal dimension of the semiconductor agglomerates. According to the fractal reaction kinetics, the time dependent rate coefficient k f (k f = k 2,ft -h) has been employed instead of the second order rate constant k 2, where the fractal parameter h describes the dimension of the system. This model could successfully be used to describe charge carrier signals in all observed time domains. Moreover, the model was compared with the concept developed by Shuttle et al., which proposes that the charge carrier signals decay following a power-law. The benefits of the fractal model proposed here include the possibility to describe and analyze influences of the morphology on the fractal parameter h and its applicability over a broad range of time domains and excitation energies.

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