Formation of Si twinning-superlattice: First step towards Si polytype growth

Research output: Contribution to journalArticleResearchpeer review

Authors

  • A. Fissel
  • E. Bugiel
  • C. R. Wang
  • H. J. Osten
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Details

Original languageEnglish
Pages (from-to)138-141
Number of pages4
JournalMaterials Science and Engineering B: Solid-State Materials for Advanced Technology
Volume134
Issue number2-3 SPEC. ISS.
Early online date21 Aug 2006
Publication statusPublished - 15 Oct 2006

Abstract

We report about the formation of twinning-superlattice regions in Si epitaxial layers grown by multi-step molecular beam epitaxy on Si (1 1 1) (sqrt(3) × sqrt(3)) R 30{ring operator}-B surfaces in which boron acts as a subsurfactant. Twinning-superlattice regions were formed by periodical arrangement of 180° rotation twins along the [1 1 1] direction separated by a few nanometers. The multi-step procedure consists of repeating several growth, boron deposition and annealing cycles on boron-predeposited undoped Si substrates. It is shown that the amount of subsurface boron and the growth mode influence the formation of twin boundaries. Only the nucleation of Si on the Si (1 1 1) (sqrt(3) × sqrt(3)) R 30{ring operator}-surface covered by at least 1/3 ML subsurface boron results in the formation of 180° rotation twins. The presented technology should be suitable to prepare Si polytypes.

Keywords

    Molecular beam epitaxy, Silicon, Superlattice, Twinning

ASJC Scopus subject areas

Cite this

Formation of Si twinning-superlattice: First step towards Si polytype growth. / Fissel, A.; Bugiel, E.; Wang, C. R. et al.
In: Materials Science and Engineering B: Solid-State Materials for Advanced Technology, Vol. 134, No. 2-3 SPEC. ISS., 15.10.2006, p. 138-141.

Research output: Contribution to journalArticleResearchpeer review

Fissel A, Bugiel E, Wang CR, Osten HJ. Formation of Si twinning-superlattice: First step towards Si polytype growth. Materials Science and Engineering B: Solid-State Materials for Advanced Technology. 2006 Oct 15;134(2-3 SPEC. ISS.):138-141. Epub 2006 Aug 21. doi: 10.1016/j.mseb.2006.06.046
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AU - Bugiel, E.

AU - Wang, C. R.

AU - Osten, H. J.

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N2 - We report about the formation of twinning-superlattice regions in Si epitaxial layers grown by multi-step molecular beam epitaxy on Si (1 1 1) (sqrt(3) × sqrt(3)) R 30{ring operator}-B surfaces in which boron acts as a subsurfactant. Twinning-superlattice regions were formed by periodical arrangement of 180° rotation twins along the [1 1 1] direction separated by a few nanometers. The multi-step procedure consists of repeating several growth, boron deposition and annealing cycles on boron-predeposited undoped Si substrates. It is shown that the amount of subsurface boron and the growth mode influence the formation of twin boundaries. Only the nucleation of Si on the Si (1 1 1) (sqrt(3) × sqrt(3)) R 30{ring operator}-surface covered by at least 1/3 ML subsurface boron results in the formation of 180° rotation twins. The presented technology should be suitable to prepare Si polytypes.

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