Formation of defects in cubic GaN grown on nano-patterned 3C-SiC (001)

Research output: Contribution to journalArticleResearchpeer review

Authors

  • R. M. Kemper
  • M. Häberlen
  • T. Schupp
  • M. Weinl
  • M. Bürger
  • M. Ruth
  • C. Meier
  • T. Niendorf
  • H. J. Maier
  • K. Lischka
  • D. J. As
  • J. K.N. Lindner

External Research Organisations

  • Paderborn University
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Details

Original languageEnglish
Pages (from-to)1028-1031
Number of pages4
JournalPhysica Status Solidi (C) Current Topics in Solid State Physics
Volume9
Issue number3-4
Publication statusPublished - 15 Feb 2012
Externally publishedYes

Abstract

We report an anisotropic formation of defects in cubic GaN grown on nano-patterned 3C-SiC/Si (001) by molecular beam epitaxy. Nano-patterning of 3C-SiC/Si (001) is achieved by nanosphere lithography and a reactive ion etching process. Atomic force microscopy and scanning electron microscopy show that the selective-area-grown cubic GaN nucleates in two structurally different domains, which most probably originate from the substrate. In adjacent domains the formation of defects, especially hexagonal inclusions, is different and leads to two different surface morphologies. The dominant phase within these domains was measured by electron backscatter diffraction. Optical properties were investigated by micro-photoluminescence and cathodoluminescence spectroscopy.

Keywords

    Defects, Molecular beam epitaxy, Nanostructures, Nitrides

ASJC Scopus subject areas

Cite this

Formation of defects in cubic GaN grown on nano-patterned 3C-SiC (001). / Kemper, R. M.; Häberlen, M.; Schupp, T. et al.
In: Physica Status Solidi (C) Current Topics in Solid State Physics, Vol. 9, No. 3-4, 15.02.2012, p. 1028-1031.

Research output: Contribution to journalArticleResearchpeer review

Kemper, RM, Häberlen, M, Schupp, T, Weinl, M, Bürger, M, Ruth, M, Meier, C, Niendorf, T, Maier, HJ, Lischka, K, As, DJ & Lindner, JKN 2012, 'Formation of defects in cubic GaN grown on nano-patterned 3C-SiC (001)', Physica Status Solidi (C) Current Topics in Solid State Physics, vol. 9, no. 3-4, pp. 1028-1031. https://doi.org/10.1002/pssc.201100174
Kemper, R. M., Häberlen, M., Schupp, T., Weinl, M., Bürger, M., Ruth, M., Meier, C., Niendorf, T., Maier, H. J., Lischka, K., As, D. J., & Lindner, J. K. N. (2012). Formation of defects in cubic GaN grown on nano-patterned 3C-SiC (001). Physica Status Solidi (C) Current Topics in Solid State Physics, 9(3-4), 1028-1031. https://doi.org/10.1002/pssc.201100174
Kemper RM, Häberlen M, Schupp T, Weinl M, Bürger M, Ruth M et al. Formation of defects in cubic GaN grown on nano-patterned 3C-SiC (001). Physica Status Solidi (C) Current Topics in Solid State Physics. 2012 Feb 15;9(3-4):1028-1031. doi: 10.1002/pssc.201100174
Kemper, R. M. ; Häberlen, M. ; Schupp, T. et al. / Formation of defects in cubic GaN grown on nano-patterned 3C-SiC (001). In: Physica Status Solidi (C) Current Topics in Solid State Physics. 2012 ; Vol. 9, No. 3-4. pp. 1028-1031.
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AU - Kemper, R. M.

AU - Häberlen, M.

AU - Schupp, T.

AU - Weinl, M.

AU - Bürger, M.

AU - Ruth, M.

AU - Meier, C.

AU - Niendorf, T.

AU - Maier, H. J.

AU - Lischka, K.

AU - As, D. J.

AU - Lindner, J. K.N.

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N2 - We report an anisotropic formation of defects in cubic GaN grown on nano-patterned 3C-SiC/Si (001) by molecular beam epitaxy. Nano-patterning of 3C-SiC/Si (001) is achieved by nanosphere lithography and a reactive ion etching process. Atomic force microscopy and scanning electron microscopy show that the selective-area-grown cubic GaN nucleates in two structurally different domains, which most probably originate from the substrate. In adjacent domains the formation of defects, especially hexagonal inclusions, is different and leads to two different surface morphologies. The dominant phase within these domains was measured by electron backscatter diffraction. Optical properties were investigated by micro-photoluminescence and cathodoluminescence spectroscopy.

AB - We report an anisotropic formation of defects in cubic GaN grown on nano-patterned 3C-SiC/Si (001) by molecular beam epitaxy. Nano-patterning of 3C-SiC/Si (001) is achieved by nanosphere lithography and a reactive ion etching process. Atomic force microscopy and scanning electron microscopy show that the selective-area-grown cubic GaN nucleates in two structurally different domains, which most probably originate from the substrate. In adjacent domains the formation of defects, especially hexagonal inclusions, is different and leads to two different surface morphologies. The dominant phase within these domains was measured by electron backscatter diffraction. Optical properties were investigated by micro-photoluminescence and cathodoluminescence spectroscopy.

KW - Defects

KW - Molecular beam epitaxy

KW - Nanostructures

KW - Nitrides

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DO - 10.1002/pssc.201100174

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JO - Physica Status Solidi (C) Current Topics in Solid State Physics

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