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Original language | English |
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Publication status | Published - 1982 |
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Flashover Voltage Dependence of the Tangential Field Strength of Contaminated Insulator Surfaces in SF6. / Brockmann, R.; Ohlshausen , R. v.
1982.
1982.
Research output: Contribution to conference › Paper › Research › peer review
Brockmann, R & Ohlshausen , RV 1982, 'Flashover Voltage Dependence of the Tangential Field Strength of Contaminated Insulator Surfaces in SF6'.
Brockmann, R., & Ohlshausen , R. V. (1982). Flashover Voltage Dependence of the Tangential Field Strength of Contaminated Insulator Surfaces in SF6.
Brockmann R, Ohlshausen RV. Flashover Voltage Dependence of the Tangential Field Strength of Contaminated Insulator Surfaces in SF6. 1982.
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title = "Flashover Voltage Dependence of the Tangential Field Strength of Contaminated Insulator Surfaces in SF6",
author = "R. Brockmann and Ohlshausen, {R. v.}",
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TY - CONF
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AU - Brockmann, R.
AU - Ohlshausen , R. v.
PY - 1982
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M3 - Paper
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