Details
Original language | English |
---|---|
Title of host publication | Commercial and Biomedical Applications of Ultrafast Lasers IV |
Subtitle of host publication | 27 - 29 January 2004, San Jose, California, USA |
Place of Publication | Bellingham |
Publisher | SPIE |
Pages | 133-145 |
Number of pages | 13 |
ISBN (print) | 0-8194-5248-3 |
Publication status | Published - 1 Jun 2004 |
Externally published | Yes |
Event | Commercial and Biomedical Applications of Ultrafast Lasers IV - San Jose, CA, United States Duration: 27 Jan 2004 → 29 Jan 2004 |
Publication series
Name | Proceedings of SPIE - The International Society for Optical Engineering |
---|---|
Publisher | SPIE |
Volume | 5340 |
ISSN (Print) | 0277-786X |
Abstract
Dielectric oxide and fluoride films used for optical coatings are studied with femtosecond laser pulses with respect to their breakdown and pre-breakdown behavior. A phenomenological model with only three figures of merit is used to explain the measured breakdown thresholds for pulse durations from 25 fs to 1 ps. The temporal evolution of the dielectric constant in the pre-breakdown regime is obtained from transient reflection and transmission measurements after taking into account standing wave effects of pump and probe. In addition to electron-electron and electron-phonon scattering processes, the creation of a new sample state after a few hundred fs is observed. The experimental data are explained with a computer simulation based on the Boltzmann equation.
Keywords
- Computer simulation of solids, Laser damage, Self-trapped excitons, Time-resolved measurements, Ultrafast processes in condensed matter
ASJC Scopus subject areas
- Materials Science(all)
- Electronic, Optical and Magnetic Materials
- Physics and Astronomy(all)
- Condensed Matter Physics
- Computer Science(all)
- Computer Science Applications
- Mathematics(all)
- Applied Mathematics
- Engineering(all)
- Electrical and Electronic Engineering
Cite this
- Standard
- Harvard
- Apa
- Vancouver
- BibTeX
- RIS
Commercial and Biomedical Applications of Ultrafast Lasers IV: 27 - 29 January 2004, San Jose, California, USA. Bellingham: SPIE, 2004. p. 133-145 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 5340).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Femtosecond breakdown and pre-breakdown behavior in dielectric thin films
AU - Mero, Mark
AU - Liu, Jianhua
AU - Sabbah, Ali J.
AU - Zeller, Joachim
AU - Rudolph, Wolfgang G.
AU - Starke, Kai
AU - Ristau, Detlev
PY - 2004/6/1
Y1 - 2004/6/1
N2 - Dielectric oxide and fluoride films used for optical coatings are studied with femtosecond laser pulses with respect to their breakdown and pre-breakdown behavior. A phenomenological model with only three figures of merit is used to explain the measured breakdown thresholds for pulse durations from 25 fs to 1 ps. The temporal evolution of the dielectric constant in the pre-breakdown regime is obtained from transient reflection and transmission measurements after taking into account standing wave effects of pump and probe. In addition to electron-electron and electron-phonon scattering processes, the creation of a new sample state after a few hundred fs is observed. The experimental data are explained with a computer simulation based on the Boltzmann equation.
AB - Dielectric oxide and fluoride films used for optical coatings are studied with femtosecond laser pulses with respect to their breakdown and pre-breakdown behavior. A phenomenological model with only three figures of merit is used to explain the measured breakdown thresholds for pulse durations from 25 fs to 1 ps. The temporal evolution of the dielectric constant in the pre-breakdown regime is obtained from transient reflection and transmission measurements after taking into account standing wave effects of pump and probe. In addition to electron-electron and electron-phonon scattering processes, the creation of a new sample state after a few hundred fs is observed. The experimental data are explained with a computer simulation based on the Boltzmann equation.
KW - Computer simulation of solids
KW - Laser damage
KW - Self-trapped excitons
KW - Time-resolved measurements
KW - Ultrafast processes in condensed matter
UR - http://www.scopus.com/inward/record.url?scp=3543140660&partnerID=8YFLogxK
U2 - 10.1117/12.538218
DO - 10.1117/12.538218
M3 - Conference contribution
AN - SCOPUS:3543140660
SN - 0-8194-5248-3
T3 - Proceedings of SPIE - The International Society for Optical Engineering
SP - 133
EP - 145
BT - Commercial and Biomedical Applications of Ultrafast Lasers IV
PB - SPIE
CY - Bellingham
T2 - Commercial and Biomedical Applications of Ultrafast Lasers IV
Y2 - 27 January 2004 through 29 January 2004
ER -