Femtosecond breakdown and pre-breakdown behavior in dielectric thin films

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • Mark Mero
  • Jianhua Liu
  • Ali J. Sabbah
  • Joachim Zeller
  • Wolfgang G. Rudolph
  • Kai Starke
  • Detlev Ristau

External Research Organisations

  • University of New Mexico
  • Fudan University
  • Laser Zentrum Hannover e.V. (LZH)
View graph of relations

Details

Original languageEnglish
Title of host publicationCommercial and Biomedical Applications of Ultrafast Lasers IV
Subtitle of host publication27 - 29 January 2004, San Jose, California, USA
Place of PublicationBellingham
PublisherSPIE
Pages133-145
Number of pages13
ISBN (print)0-8194-5248-3
Publication statusPublished - 1 Jun 2004
Externally publishedYes
EventCommercial and Biomedical Applications of Ultrafast Lasers IV - San Jose, CA, United States
Duration: 27 Jan 200429 Jan 2004

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Volume5340
ISSN (Print)0277-786X

Abstract

Dielectric oxide and fluoride films used for optical coatings are studied with femtosecond laser pulses with respect to their breakdown and pre-breakdown behavior. A phenomenological model with only three figures of merit is used to explain the measured breakdown thresholds for pulse durations from 25 fs to 1 ps. The temporal evolution of the dielectric constant in the pre-breakdown regime is obtained from transient reflection and transmission measurements after taking into account standing wave effects of pump and probe. In addition to electron-electron and electron-phonon scattering processes, the creation of a new sample state after a few hundred fs is observed. The experimental data are explained with a computer simulation based on the Boltzmann equation.

Keywords

    Computer simulation of solids, Laser damage, Self-trapped excitons, Time-resolved measurements, Ultrafast processes in condensed matter

ASJC Scopus subject areas

Cite this

Femtosecond breakdown and pre-breakdown behavior in dielectric thin films. / Mero, Mark; Liu, Jianhua; Sabbah, Ali J. et al.
Commercial and Biomedical Applications of Ultrafast Lasers IV: 27 - 29 January 2004, San Jose, California, USA. Bellingham: SPIE, 2004. p. 133-145 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 5340).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Mero, M, Liu, J, Sabbah, AJ, Zeller, J, Rudolph, WG, Starke, K & Ristau, D 2004, Femtosecond breakdown and pre-breakdown behavior in dielectric thin films. in Commercial and Biomedical Applications of Ultrafast Lasers IV: 27 - 29 January 2004, San Jose, California, USA. Proceedings of SPIE - The International Society for Optical Engineering, vol. 5340, SPIE, Bellingham, pp. 133-145, Commercial and Biomedical Applications of Ultrafast Lasers IV, San Jose, CA, United States, 27 Jan 2004. https://doi.org/10.1117/12.538218
Mero, M., Liu, J., Sabbah, A. J., Zeller, J., Rudolph, W. G., Starke, K., & Ristau, D. (2004). Femtosecond breakdown and pre-breakdown behavior in dielectric thin films. In Commercial and Biomedical Applications of Ultrafast Lasers IV: 27 - 29 January 2004, San Jose, California, USA (pp. 133-145). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 5340). SPIE. https://doi.org/10.1117/12.538218
Mero M, Liu J, Sabbah AJ, Zeller J, Rudolph WG, Starke K et al. Femtosecond breakdown and pre-breakdown behavior in dielectric thin films. In Commercial and Biomedical Applications of Ultrafast Lasers IV: 27 - 29 January 2004, San Jose, California, USA. Bellingham: SPIE. 2004. p. 133-145. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.538218
Mero, Mark ; Liu, Jianhua ; Sabbah, Ali J. et al. / Femtosecond breakdown and pre-breakdown behavior in dielectric thin films. Commercial and Biomedical Applications of Ultrafast Lasers IV: 27 - 29 January 2004, San Jose, California, USA. Bellingham : SPIE, 2004. pp. 133-145 (Proceedings of SPIE - The International Society for Optical Engineering).
Download
@inproceedings{a6aa5dc0c05e4bb0b73669d7579657dc,
title = "Femtosecond breakdown and pre-breakdown behavior in dielectric thin films",
abstract = "Dielectric oxide and fluoride films used for optical coatings are studied with femtosecond laser pulses with respect to their breakdown and pre-breakdown behavior. A phenomenological model with only three figures of merit is used to explain the measured breakdown thresholds for pulse durations from 25 fs to 1 ps. The temporal evolution of the dielectric constant in the pre-breakdown regime is obtained from transient reflection and transmission measurements after taking into account standing wave effects of pump and probe. In addition to electron-electron and electron-phonon scattering processes, the creation of a new sample state after a few hundred fs is observed. The experimental data are explained with a computer simulation based on the Boltzmann equation.",
keywords = "Computer simulation of solids, Laser damage, Self-trapped excitons, Time-resolved measurements, Ultrafast processes in condensed matter",
author = "Mark Mero and Jianhua Liu and Sabbah, {Ali J.} and Joachim Zeller and Rudolph, {Wolfgang G.} and Kai Starke and Detlev Ristau",
year = "2004",
month = jun,
day = "1",
doi = "10.1117/12.538218",
language = "English",
isbn = "0-8194-5248-3",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
pages = "133--145",
booktitle = "Commercial and Biomedical Applications of Ultrafast Lasers IV",
address = "United States",
note = "Commercial and Biomedical Applications of Ultrafast Lasers IV ; Conference date: 27-01-2004 Through 29-01-2004",

}

Download

TY - GEN

T1 - Femtosecond breakdown and pre-breakdown behavior in dielectric thin films

AU - Mero, Mark

AU - Liu, Jianhua

AU - Sabbah, Ali J.

AU - Zeller, Joachim

AU - Rudolph, Wolfgang G.

AU - Starke, Kai

AU - Ristau, Detlev

PY - 2004/6/1

Y1 - 2004/6/1

N2 - Dielectric oxide and fluoride films used for optical coatings are studied with femtosecond laser pulses with respect to their breakdown and pre-breakdown behavior. A phenomenological model with only three figures of merit is used to explain the measured breakdown thresholds for pulse durations from 25 fs to 1 ps. The temporal evolution of the dielectric constant in the pre-breakdown regime is obtained from transient reflection and transmission measurements after taking into account standing wave effects of pump and probe. In addition to electron-electron and electron-phonon scattering processes, the creation of a new sample state after a few hundred fs is observed. The experimental data are explained with a computer simulation based on the Boltzmann equation.

AB - Dielectric oxide and fluoride films used for optical coatings are studied with femtosecond laser pulses with respect to their breakdown and pre-breakdown behavior. A phenomenological model with only three figures of merit is used to explain the measured breakdown thresholds for pulse durations from 25 fs to 1 ps. The temporal evolution of the dielectric constant in the pre-breakdown regime is obtained from transient reflection and transmission measurements after taking into account standing wave effects of pump and probe. In addition to electron-electron and electron-phonon scattering processes, the creation of a new sample state after a few hundred fs is observed. The experimental data are explained with a computer simulation based on the Boltzmann equation.

KW - Computer simulation of solids

KW - Laser damage

KW - Self-trapped excitons

KW - Time-resolved measurements

KW - Ultrafast processes in condensed matter

UR - http://www.scopus.com/inward/record.url?scp=3543140660&partnerID=8YFLogxK

U2 - 10.1117/12.538218

DO - 10.1117/12.538218

M3 - Conference contribution

AN - SCOPUS:3543140660

SN - 0-8194-5248-3

T3 - Proceedings of SPIE - The International Society for Optical Engineering

SP - 133

EP - 145

BT - Commercial and Biomedical Applications of Ultrafast Lasers IV

PB - SPIE

CY - Bellingham

T2 - Commercial and Biomedical Applications of Ultrafast Lasers IV

Y2 - 27 January 2004 through 29 January 2004

ER -