Fast Evaluation of Rooftop and Façade PV Potentials Using Backward Ray Tracing and Machine Learning

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • Dennis Bredemeier
  • Carsten Schinke
  • Timo Gewohn
  • Hannes Wagner-Mohnsen
  • Raphael Niepelt
  • Rolf Brendel

External Research Organisations

  • Institute for Solar Energy Research (ISFH)
  • Wavelabs Solar Metrology Systems GmbH
View graph of relations

Details

Original languageEnglish
Title of host publication2021 IEEE 48th Photovoltaic Specialists Conference
Subtitle of host publication PVSC 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages294-299
Number of pages6
ISBN (electronic)9781665419222
Publication statusPublished - 2021
Event48th IEEE Photovoltaic Specialists Conference, PVSC 2021 - Fort Lauderdale, United States
Duration: 20 Jun 202125 Jun 2021

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)0160-8371

Abstract

The accurate calculation of annual insolation for a large amount of building surfaces in urban environments is a key prerequisite for a targeted increase of the installed PV capacity. In this study, we build a digital city model upon publicly available geographic data. We use this model in combination with machine learning for performing PV potential analyses on large scales and at low computational costs. We train the machine learning algorithm using ground truth values for insolation, which we determine from forward ray tracing calculations for the city of Hanover, Germany. We find that our machine learning approach is able to predict the annual insolation for all types of building surfaces independent from their tilt and orientation. The RMSE relative to the mean ground truth value is 3.2% for rooftops and 8.8% for facades. The calculation time is reduced by a factor of 20 compared to the forward ray tracing approach.

Keywords

    machine learning, PV potential analysis, ray tracing

ASJC Scopus subject areas

Cite this

Fast Evaluation of Rooftop and Façade PV Potentials Using Backward Ray Tracing and Machine Learning. / Bredemeier, Dennis; Schinke, Carsten; Gewohn, Timo et al.
2021 IEEE 48th Photovoltaic Specialists Conference: PVSC 2021. Institute of Electrical and Electronics Engineers Inc., 2021. p. 294-299 (Conference Record of the IEEE Photovoltaic Specialists Conference).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Bredemeier, D, Schinke, C, Gewohn, T, Wagner-Mohnsen, H, Niepelt, R & Brendel, R 2021, Fast Evaluation of Rooftop and Façade PV Potentials Using Backward Ray Tracing and Machine Learning. in 2021 IEEE 48th Photovoltaic Specialists Conference: PVSC 2021. Conference Record of the IEEE Photovoltaic Specialists Conference, Institute of Electrical and Electronics Engineers Inc., pp. 294-299, 48th IEEE Photovoltaic Specialists Conference, PVSC 2021, Fort Lauderdale, United States, 20 Jun 2021. https://doi.org/10.1109/PVSC43889.2021.9518660
Bredemeier, D., Schinke, C., Gewohn, T., Wagner-Mohnsen, H., Niepelt, R., & Brendel, R. (2021). Fast Evaluation of Rooftop and Façade PV Potentials Using Backward Ray Tracing and Machine Learning. In 2021 IEEE 48th Photovoltaic Specialists Conference: PVSC 2021 (pp. 294-299). (Conference Record of the IEEE Photovoltaic Specialists Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC43889.2021.9518660
Bredemeier D, Schinke C, Gewohn T, Wagner-Mohnsen H, Niepelt R, Brendel R. Fast Evaluation of Rooftop and Façade PV Potentials Using Backward Ray Tracing and Machine Learning. In 2021 IEEE 48th Photovoltaic Specialists Conference: PVSC 2021. Institute of Electrical and Electronics Engineers Inc. 2021. p. 294-299. (Conference Record of the IEEE Photovoltaic Specialists Conference). doi: 10.1109/PVSC43889.2021.9518660
Bredemeier, Dennis ; Schinke, Carsten ; Gewohn, Timo et al. / Fast Evaluation of Rooftop and Façade PV Potentials Using Backward Ray Tracing and Machine Learning. 2021 IEEE 48th Photovoltaic Specialists Conference: PVSC 2021. Institute of Electrical and Electronics Engineers Inc., 2021. pp. 294-299 (Conference Record of the IEEE Photovoltaic Specialists Conference).
Download
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