Fast and Easily Implementable Detection Circuits for Short Circuits of Power Semiconductors

Research output: Contribution to journalArticleResearchpeer review

Authors

  • Tobias Krone
  • Chengzhi Xu
  • Axel Mertens
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Details

Original languageEnglish
Pages (from-to)2871-2879
Number of pages9
JournalIEEE Transactions on Industry Applications
Volume53
Issue number3
Publication statusPublished - 2017

Abstract

Short-circuit detection is a fundamental function of most inverters. In this paper, two new fast and easily implementable short-circuit detection approaches are presented. The first one offers a significantly accelerated desaturation detection. The second one allows a full inverter to be protected by only one short-circuit detection circuit. Both approaches are verified by simulations and hardware tests.

Keywords

    Desaturation detection, fault analysis, insulated-gate bipolar transistor (IGBT), short circuit

ASJC Scopus subject areas

Cite this

Fast and Easily Implementable Detection Circuits for Short Circuits of Power Semiconductors. / Krone, Tobias; Xu, Chengzhi; Mertens, Axel.
In: IEEE Transactions on Industry Applications, Vol. 53, No. 3, 2017, p. 2871-2879.

Research output: Contribution to journalArticleResearchpeer review

Krone, Tobias ; Xu, Chengzhi ; Mertens, Axel. / Fast and Easily Implementable Detection Circuits for Short Circuits of Power Semiconductors. In: IEEE Transactions on Industry Applications. 2017 ; Vol. 53, No. 3. pp. 2871-2879.
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