Details
| Original language | English |
|---|---|
| Article number | 8644010 |
| Journal | IEEE Transactions on Applied Superconductivity |
| Volume | 29 |
| Issue number | 5 |
| Publication status | Published - Aug 2019 |
| Externally published | Yes |
Abstract
Josephson cantilevers are employed to measure the three-dimensional radiation distribution at microwave frequencies and up to the terahertz regime. Epitaxial YBa2Cu3O7 Josephson junctions with high IcRn products are required at these frequencies. The commonly used epitaxial Josephson junctions on LaAlO3 bicrystal substrates fulfill these requirements but exhibit significant variance in their electronic properties. In addition, the substrate losses have to be minimized and, therefore, only substrate materials with low relative permittivity r and loss tangent tan δ in the microwave regime are suitable. The fabrication is realized by optimized pulsed laser deposition of YBa2Cu3O7. The separated devices are automatically characterized including the electric I-V curves and temperature dependence. In addition, the microwave properties are determined in our terahertz microscope at 762 GHz with a far infrared laser system and low-noise measurement electronics. The Josephson cantilevers are used to measure the spatial power distribution of the laser beam by differential resistance analysis and by Hilbert transform of the first Shapiro step. The latter approach shows a good agreement with the expected beam profile.
Keywords
- Hilbert spectroscopy, Josephson junction, technology, Terahertz microscope, YBCO
ASJC Scopus subject areas
- Materials Science(all)
- Electronic, Optical and Magnetic Materials
- Physics and Astronomy(all)
- Condensed Matter Physics
- Engineering(all)
- Electrical and Electronic Engineering
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In: IEEE Transactions on Applied Superconductivity, Vol. 29, No. 5, 8644010, 08.2019.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - Fabrication and Properties of Josephson Junction Cantilevers for Terahertz Applications
AU - Elenskiy, Ilya
AU - Tollkuhn, Marco
AU - Kajevic, Denis
AU - Martens, Michael
AU - Hampel, Benedikt
AU - Schilling, Meinhard
N1 - Funding information: Manuscript received October 30, 2018; accepted February 13, 2019. Date of publication February 19, 2019; date of current version April 5, 2019. This work was supported in part by the Braunschweig International Graduate School of Metrology B-IGSM, in part by the DFG Research Training Group GrK 1952/1 “Metrology for Complex Nanosystems,” in part by the Laboratory for Emerging Nanometrology—LENA, in part by the Cluster of Excellence–Quantum Frontiers, and in part by the Young Researcher Program of MWK, Federal State of Lower Saxony, Germany. (Corresponding author: Ilya Elenskiy.) The authors are with the Institut für Elektrische Messtechnik und Grundlagen der Elektrotechnik, TU Braunschweig, 38106 Braunschweig, Germany (e-mail:, i.elenskiy@tu-bs.de; d.kajevic@tu-braunschweig.de).
PY - 2019/8
Y1 - 2019/8
N2 - Josephson cantilevers are employed to measure the three-dimensional radiation distribution at microwave frequencies and up to the terahertz regime. Epitaxial YBa2Cu3O7 Josephson junctions with high IcRn products are required at these frequencies. The commonly used epitaxial Josephson junctions on LaAlO3 bicrystal substrates fulfill these requirements but exhibit significant variance in their electronic properties. In addition, the substrate losses have to be minimized and, therefore, only substrate materials with low relative permittivity r and loss tangent tan δ in the microwave regime are suitable. The fabrication is realized by optimized pulsed laser deposition of YBa2Cu3O7. The separated devices are automatically characterized including the electric I-V curves and temperature dependence. In addition, the microwave properties are determined in our terahertz microscope at 762 GHz with a far infrared laser system and low-noise measurement electronics. The Josephson cantilevers are used to measure the spatial power distribution of the laser beam by differential resistance analysis and by Hilbert transform of the first Shapiro step. The latter approach shows a good agreement with the expected beam profile.
AB - Josephson cantilevers are employed to measure the three-dimensional radiation distribution at microwave frequencies and up to the terahertz regime. Epitaxial YBa2Cu3O7 Josephson junctions with high IcRn products are required at these frequencies. The commonly used epitaxial Josephson junctions on LaAlO3 bicrystal substrates fulfill these requirements but exhibit significant variance in their electronic properties. In addition, the substrate losses have to be minimized and, therefore, only substrate materials with low relative permittivity r and loss tangent tan δ in the microwave regime are suitable. The fabrication is realized by optimized pulsed laser deposition of YBa2Cu3O7. The separated devices are automatically characterized including the electric I-V curves and temperature dependence. In addition, the microwave properties are determined in our terahertz microscope at 762 GHz with a far infrared laser system and low-noise measurement electronics. The Josephson cantilevers are used to measure the spatial power distribution of the laser beam by differential resistance analysis and by Hilbert transform of the first Shapiro step. The latter approach shows a good agreement with the expected beam profile.
KW - Hilbert spectroscopy
KW - Josephson junction
KW - technology
KW - Terahertz microscope
KW - YBCO
UR - http://www.scopus.com/inward/record.url?scp=85064670396&partnerID=8YFLogxK
U2 - 10.1109/tasc.2019.2900217
DO - 10.1109/tasc.2019.2900217
M3 - Article
AN - SCOPUS:85064670396
VL - 29
JO - IEEE Transactions on Applied Superconductivity
JF - IEEE Transactions on Applied Superconductivity
SN - 1051-8223
IS - 5
M1 - 8644010
ER -