Experiments on scaling in AlxGa1-xAs/GaAs heterostructures under quantum Hall conditions

Research output: Contribution to journalArticleResearchpeer review

Authors

External Research Organisations

  • Max Planck Institute for Solid State Research (MPI-FKF)
View graph of relations

Details

Original languageEnglish
Pages (from-to)6828-6831
Number of pages4
JournalPhysical Review B
Volume43
Issue number8
Publication statusPublished - 1 Jan 1991
Externally publishedYes

Abstract

The influence of repulsive (Be) and attractive (Si) scattering centers on the temperature-dependent half-width of the Shubnikovde Haas peaks B(T) and the maximum of the slope of the Hall resistance xy/B has been investigated at millikelvin temperatures for the two-dimensional electron gas in AlxGa1-xAs/GaAs heterostructures. Both sheet-doped and homogeneously doped samples were studied. In contrast to results reported for InxGa1-xAs/InP heterostructures, where a scaling exponent =0.42±0.04 with BT and (xy/B)maxT- is found and suggested to be universal, our data lead to scaling exponents that systematically increase with decreasing mobility. The transition between the integer filling factor 1 and the fractional filling factor 2/3 has been studied and a scaling behavior observed.

ASJC Scopus subject areas

Cite this

Experiments on scaling in AlxGa1-xAs/GaAs heterostructures under quantum Hall conditions. / Koch, S.; Haug, R. J.; Klitzing, K. V. et al.
In: Physical Review B, Vol. 43, No. 8, 01.01.1991, p. 6828-6831.

Research output: Contribution to journalArticleResearchpeer review

Koch S, Haug RJ, Klitzing KV, Ploog K. Experiments on scaling in AlxGa1-xAs/GaAs heterostructures under quantum Hall conditions. Physical Review B. 1991 Jan 1;43(8):6828-6831. doi: 10.1103/PhysRevB.43.6828
Koch, S. ; Haug, R. J. ; Klitzing, K. V. et al. / Experiments on scaling in AlxGa1-xAs/GaAs heterostructures under quantum Hall conditions. In: Physical Review B. 1991 ; Vol. 43, No. 8. pp. 6828-6831.
Download
@article{d7c2a58a001f4408b41a1a87c61ff7e3,
title = "Experiments on scaling in AlxGa1-xAs/GaAs heterostructures under quantum Hall conditions",
abstract = "The influence of repulsive (Be) and attractive (Si) scattering centers on the temperature-dependent half-width of the Shubnikovde Haas peaks B(T) and the maximum of the slope of the Hall resistance xy/B has been investigated at millikelvin temperatures for the two-dimensional electron gas in AlxGa1-xAs/GaAs heterostructures. Both sheet-doped and homogeneously doped samples were studied. In contrast to results reported for InxGa1-xAs/InP heterostructures, where a scaling exponent =0.42±0.04 with BT and (xy/B)maxT- is found and suggested to be universal, our data lead to scaling exponents that systematically increase with decreasing mobility. The transition between the integer filling factor 1 and the fractional filling factor 2/3 has been studied and a scaling behavior observed.",
author = "S. Koch and Haug, {R. J.} and Klitzing, {K. V.} and K. Ploog",
year = "1991",
month = jan,
day = "1",
doi = "10.1103/PhysRevB.43.6828",
language = "English",
volume = "43",
pages = "6828--6831",
journal = "Physical Review B",
issn = "0163-1829",
publisher = "American Institute of Physics",
number = "8",

}

Download

TY - JOUR

T1 - Experiments on scaling in AlxGa1-xAs/GaAs heterostructures under quantum Hall conditions

AU - Koch, S.

AU - Haug, R. J.

AU - Klitzing, K. V.

AU - Ploog, K.

PY - 1991/1/1

Y1 - 1991/1/1

N2 - The influence of repulsive (Be) and attractive (Si) scattering centers on the temperature-dependent half-width of the Shubnikovde Haas peaks B(T) and the maximum of the slope of the Hall resistance xy/B has been investigated at millikelvin temperatures for the two-dimensional electron gas in AlxGa1-xAs/GaAs heterostructures. Both sheet-doped and homogeneously doped samples were studied. In contrast to results reported for InxGa1-xAs/InP heterostructures, where a scaling exponent =0.42±0.04 with BT and (xy/B)maxT- is found and suggested to be universal, our data lead to scaling exponents that systematically increase with decreasing mobility. The transition between the integer filling factor 1 and the fractional filling factor 2/3 has been studied and a scaling behavior observed.

AB - The influence of repulsive (Be) and attractive (Si) scattering centers on the temperature-dependent half-width of the Shubnikovde Haas peaks B(T) and the maximum of the slope of the Hall resistance xy/B has been investigated at millikelvin temperatures for the two-dimensional electron gas in AlxGa1-xAs/GaAs heterostructures. Both sheet-doped and homogeneously doped samples were studied. In contrast to results reported for InxGa1-xAs/InP heterostructures, where a scaling exponent =0.42±0.04 with BT and (xy/B)maxT- is found and suggested to be universal, our data lead to scaling exponents that systematically increase with decreasing mobility. The transition between the integer filling factor 1 and the fractional filling factor 2/3 has been studied and a scaling behavior observed.

UR - http://www.scopus.com/inward/record.url?scp=26744450450&partnerID=8YFLogxK

U2 - 10.1103/PhysRevB.43.6828

DO - 10.1103/PhysRevB.43.6828

M3 - Article

AN - SCOPUS:26744450450

VL - 43

SP - 6828

EP - 6831

JO - Physical Review B

JF - Physical Review B

SN - 0163-1829

IS - 8

ER -

By the same author(s)