Details
| Original language | English |
|---|---|
| Title of host publication | 2008 International Symposium on Electromagnetic Compatibility |
| Subtitle of host publication | EMC Europe |
| Publication status | Published - 2008 |
| Event | 2008 IEEE International Symposium on Electromagnetic Compatibility, EMC 2008 - Detroit, United States Duration: 18 Aug 2008 → 22 Aug 2008 |
Publication series
| Name | IEEE International Symposium on Electromagnetic Compatibility |
|---|---|
| ISSN (Print) | 1077-4076 |
Abstract
This document shows a new method for estimating the perturbation thresholds of electronic circuits while exposed by an electromagnetic field. The method is based on a simplified calculation of the coupled-in waveforms. It is compared to a former proposed estimation approach based on mathematical norms. Both investigated techniques are compared to measurements of real electronic systems.
Keywords
- Breakdown, Coupling, Electronic, IEMI, Intentional, Transient
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Condensed Matter Physics
- Engineering(all)
- Electrical and Electronic Engineering
Cite this
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2008 International Symposium on Electromagnetic Compatibility: EMC Europe. 2008. (IEEE International Symposium on Electromagnetic Compatibility).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Evaluation of the Disturbing Potential of IEMI using Mathematical Norms and Analytical Calculations
AU - Korte, Sven
AU - Garbe, Heyno
PY - 2008
Y1 - 2008
N2 - This document shows a new method for estimating the perturbation thresholds of electronic circuits while exposed by an electromagnetic field. The method is based on a simplified calculation of the coupled-in waveforms. It is compared to a former proposed estimation approach based on mathematical norms. Both investigated techniques are compared to measurements of real electronic systems.
AB - This document shows a new method for estimating the perturbation thresholds of electronic circuits while exposed by an electromagnetic field. The method is based on a simplified calculation of the coupled-in waveforms. It is compared to a former proposed estimation approach based on mathematical norms. Both investigated techniques are compared to measurements of real electronic systems.
KW - Breakdown
KW - Coupling
KW - Electronic
KW - IEMI
KW - Intentional
KW - Transient
UR - http://www.scopus.com/inward/record.url?scp=63549119190&partnerID=8YFLogxK
U2 - 10.1109/EMCEUROPE.2008.4786915
DO - 10.1109/EMCEUROPE.2008.4786915
M3 - Conference contribution
AN - SCOPUS:63549119190
T3 - IEEE International Symposium on Electromagnetic Compatibility
BT - 2008 International Symposium on Electromagnetic Compatibility
T2 - 2008 IEEE International Symposium on Electromagnetic Compatibility, EMC 2008
Y2 - 18 August 2008 through 22 August 2008
ER -