Evaluating Consensus in Experimental K-ratios from over 40 WDS and EDS Measurement Systems

Research output: Contribution to journalArticleResearchpeer review

Authors

  • W. O. Nachlas
  • A. Moy
  • N. Ritchie
  • J. Donovan
  • J. H. Fournelle
  • J. Allaz
  • R. Almeev
  • E. S. Bullock
  • J. W. DesOrmeau
  • K. Goemann
  • R. Hoffmann
  • P. Jokubauskas
  • N. Jöns
  • T. Lam
  • A. Locock
  • D. M. Ruscitto
  • E. P. Vicenzi
  • A. von der Handt
  • B. Wade
  • P. Yang
  • D. Zhang

Research Organisations

External Research Organisations

  • University of Wisconsin
  • National Institute of Standards and Technology (NIST)
  • University of Oregon
  • ETH Zurich
  • Carnegie Institution of Washington
  • University of Nevada, Reno
  • University of Tasmania
  • Ruhr-Universität Bochum
  • University of Warsaw
  • Smithsonian Institution
  • University of Alberta
  • University of British Columbia
  • University of Adelaide
  • University of Manitoba
  • CAS - Institute of Geology and Geophysics
  • General Electric Research
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Details

Original languageEnglish
Pages (from-to)225-226
Number of pages2
JournalMicroscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Volume29
Issue number1
Early online date22 Jul 2023
Publication statusPublished - 1 Aug 2023

ASJC Scopus subject areas

Cite this

Evaluating Consensus in Experimental K-ratios from over 40 WDS and EDS Measurement Systems. / Nachlas, W. O.; Moy, A.; Ritchie, N. et al.
In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, Vol. 29, No. 1, 01.08.2023, p. 225-226.

Research output: Contribution to journalArticleResearchpeer review

Nachlas, WO, Moy, A, Ritchie, N, Donovan, J, Fournelle, JH, Allaz, J, Almeev, R, Bullock, ES, DesOrmeau, JW, Goemann, K, Hoffmann, R, Jokubauskas, P, Jöns, N, Lam, T, Locock, A, Ruscitto, DM, Vicenzi, EP, von der Handt, A, Wade, B, Yang, P & Zhang, D 2023, 'Evaluating Consensus in Experimental K-ratios from over 40 WDS and EDS Measurement Systems', Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, vol. 29, no. 1, pp. 225-226. https://doi.org/10.1093/micmic/ozad067.100
Nachlas, W. O., Moy, A., Ritchie, N., Donovan, J., Fournelle, J. H., Allaz, J., Almeev, R., Bullock, E. S., DesOrmeau, J. W., Goemann, K., Hoffmann, R., Jokubauskas, P., Jöns, N., Lam, T., Locock, A., Ruscitto, D. M., Vicenzi, E. P., von der Handt, A., Wade, B., ... Zhang, D. (2023). Evaluating Consensus in Experimental K-ratios from over 40 WDS and EDS Measurement Systems. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 29(1), 225-226. https://doi.org/10.1093/micmic/ozad067.100
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AU - Nachlas, W. O.

AU - Moy, A.

AU - Ritchie, N.

AU - Donovan, J.

AU - Fournelle, J. H.

AU - Allaz, J.

AU - Almeev, R.

AU - Bullock, E. S.

AU - DesOrmeau, J. W.

AU - Goemann, K.

AU - Hoffmann, R.

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AU - Jöns, N.

AU - Lam, T.

AU - Locock, A.

AU - Ruscitto, D. M.

AU - Vicenzi, E. P.

AU - von der Handt, A.

AU - Wade, B.

AU - Yang, P.

AU - Zhang, D.

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VL - 29

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JO - Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

JF - Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

SN - 1431-9276

IS - 1

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