Details
| Original language | English |
|---|---|
| Pages (from-to) | 446 |
| Number of pages | 1 |
| Journal | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
| Volume | 40 |
| Issue number | 1 |
| Publication status | Published - Jan 2001 |
ASJC Scopus subject areas
- Engineering(all)
- General Engineering
- Physics and Astronomy(all)
- General Physics and Astronomy
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Erratum: Accurate method for the determination of bulk minority-carrier lifetimes of mono- and multicrystalline silicon wafers. / Schmidt, J.; Aberle, A. G.
In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 40, No. 1, 01.2001, p. 446.
In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 40, No. 1, 01.2001, p. 446.
Research output: Contribution to journal › Comment/debate › Research › peer review
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@article{5fc7e030c8b34293b464da103f1c61a3,
title = "Erratum: Accurate method for the determination of bulk minority-carrier lifetimes of mono- and multicrystalline silicon wafers",
author = "J. Schmidt and Aberle, {A. G.}",
year = "2001",
month = jan,
language = "English",
volume = "40",
pages = "446",
journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers",
issn = "0021-4922",
publisher = "Japan Society of Applied Physics",
number = "1",
}
Download
TY - JOUR
T1 - Erratum
T2 - Accurate method for the determination of bulk minority-carrier lifetimes of mono- and multicrystalline silicon wafers
AU - Schmidt, J.
AU - Aberle, A. G.
PY - 2001/1
Y1 - 2001/1
UR - http://www.scopus.com/inward/record.url?scp=0035056398&partnerID=8YFLogxK
M3 - Comment/debate
AN - SCOPUS:0035056398
VL - 40
SP - 446
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
SN - 0021-4922
IS - 1
ER -