Details
| Original language | English |
|---|---|
| Title of host publication | 2014 IEEE International Symposium on Electromagnetic Compatibility |
| Subtitle of host publication | EMC |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 899-902 |
| Number of pages | 4 |
| Edition | September |
| ISBN (electronic) | 9781479955442 |
| Publication status | Published - 2014 |
| Event | 2014 IEEE International Symposium on Electromagnetic Compatibility, EMC 2014 - Raleigh, United States Duration: 3 Aug 2014 → 8 Aug 2014 |
Publication series
| Name | IEEE International Symposium on Electromagnetic Compatibility |
|---|---|
| Number | September |
| Volume | 2014-September |
| ISSN (Print) | 1077-4076 |
| ISSN (electronic) | 2158-1118 |
Abstract
The expanded measurement uncertainty of both the measurement of radiated emission and the measurement of electromagnetic field immunity depends mostly on the field distribution within the testing volume. In general, that uncertainty contribution has to be estimated from sampled measurement data. In most cases this results in an overestimation. The estimate can be reduced by exact knowledge of the field distribution and extensive measurements. In this paper a method is described, that calculates enhanced estimates from the calibration data of the test method. This calibration data has to be measured for the validation of the test volume and thus there is no need to perform another extensive measurement to calculate the uncertainty contribution. The enhanced estimate is obtained from the combination of analytical knowledge of the theoretical field distribution, measurement data and stochastical methods. The theory explained in this paper is applied to the calibration data of a GTEM 1250. It is shown, that the estimates are in good agreement with uncertainty contributions obtained from more extensive measurements.
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Condensed Matter Physics
- Engineering(all)
- Electrical and Electronic Engineering
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2014 IEEE International Symposium on Electromagnetic Compatibility: EMC. September. ed. Institute of Electrical and Electronics Engineers Inc., 2014. p. 899-902 6899095 (IEEE International Symposium on Electromagnetic Compatibility; Vol. 2014-September, No. September).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Enhanced Estimates of Field Distribution’s Uncertainty Contribution for TEM Waveguides
AU - Hamann, David
AU - Garbe, Heyno
PY - 2014
Y1 - 2014
N2 - The expanded measurement uncertainty of both the measurement of radiated emission and the measurement of electromagnetic field immunity depends mostly on the field distribution within the testing volume. In general, that uncertainty contribution has to be estimated from sampled measurement data. In most cases this results in an overestimation. The estimate can be reduced by exact knowledge of the field distribution and extensive measurements. In this paper a method is described, that calculates enhanced estimates from the calibration data of the test method. This calibration data has to be measured for the validation of the test volume and thus there is no need to perform another extensive measurement to calculate the uncertainty contribution. The enhanced estimate is obtained from the combination of analytical knowledge of the theoretical field distribution, measurement data and stochastical methods. The theory explained in this paper is applied to the calibration data of a GTEM 1250. It is shown, that the estimates are in good agreement with uncertainty contributions obtained from more extensive measurements.
AB - The expanded measurement uncertainty of both the measurement of radiated emission and the measurement of electromagnetic field immunity depends mostly on the field distribution within the testing volume. In general, that uncertainty contribution has to be estimated from sampled measurement data. In most cases this results in an overestimation. The estimate can be reduced by exact knowledge of the field distribution and extensive measurements. In this paper a method is described, that calculates enhanced estimates from the calibration data of the test method. This calibration data has to be measured for the validation of the test volume and thus there is no need to perform another extensive measurement to calculate the uncertainty contribution. The enhanced estimate is obtained from the combination of analytical knowledge of the theoretical field distribution, measurement data and stochastical methods. The theory explained in this paper is applied to the calibration data of a GTEM 1250. It is shown, that the estimates are in good agreement with uncertainty contributions obtained from more extensive measurements.
UR - http://www.scopus.com/inward/record.url?scp=84931834767&partnerID=8YFLogxK
U2 - 10.1109/ISEMC.2014.6899095
DO - 10.1109/ISEMC.2014.6899095
M3 - Conference contribution
AN - SCOPUS:84931834767
T3 - IEEE International Symposium on Electromagnetic Compatibility
SP - 899
EP - 902
BT - 2014 IEEE International Symposium on Electromagnetic Compatibility
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2014 IEEE International Symposium on Electromagnetic Compatibility, EMC 2014
Y2 - 3 August 2014 through 8 August 2014
ER -