EMC influence of the charge pump in linear regulators - Design, simulation and measurements

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

External Research Organisations

  • Texas Instruments
  • Reutlingen University
  • Robert Bosch Centre for Power Electronics (RBZ)
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Details

Original languageEnglish
Title of host publication2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011
Pages1359-1362
Number of pages4
Publication statusPublished - 2011
Externally publishedYes
Event2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011 - Rio de Janeiro, Brazil
Duration: 15 May 201118 May 2011

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
ISSN (Print)0271-4310

Abstract

The charge pump belongs to the most critical blocks for electromagnetic compatibility (EMC) of low dropout linear regulators (LDO) because of its switching nature. The goal of this paper is to contribute charge pump design practice and a prediction method for the LDO EMC performance already in an early design phase. LDO noise coupling mechanisms are analyzed. EMC aware circuit design includes the choice of low noise architectures, the right switching frequency and noise filtering. The derived simulation method shows very good matching with EMC test results for an LDO with two different charge pumps fabricated in 350nm high-voltage BiCMOS technology. For a realistic prediction of the EMC noise magnitude, a relatively simple simulation setup gives results with #60;3dBV accuracy. A trippler current mode charge pump turned out to be well suitable for EMC. Conducted emissions could be predicted and confirmed to be improved by 50dBV versus a conventional voltage mode charge pump.

ASJC Scopus subject areas

Cite this

EMC influence of the charge pump in linear regulators - Design, simulation and measurements. / Wittmann, Juergen; Wicht, Bernhard.
2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011. 2011. p. 1359-1362 5937824 (Proceedings - IEEE International Symposium on Circuits and Systems).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Wittmann, J & Wicht, B 2011, EMC influence of the charge pump in linear regulators - Design, simulation and measurements. in 2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011., 5937824, Proceedings - IEEE International Symposium on Circuits and Systems, pp. 1359-1362, 2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011, Rio de Janeiro, Brazil, 15 May 2011. https://doi.org/10.1109/ISCAS.2011.5937824
Wittmann, J., & Wicht, B. (2011). EMC influence of the charge pump in linear regulators - Design, simulation and measurements. In 2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011 (pp. 1359-1362). Article 5937824 (Proceedings - IEEE International Symposium on Circuits and Systems). https://doi.org/10.1109/ISCAS.2011.5937824
Wittmann J, Wicht B. EMC influence of the charge pump in linear regulators - Design, simulation and measurements. In 2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011. 2011. p. 1359-1362. 5937824. (Proceedings - IEEE International Symposium on Circuits and Systems). doi: 10.1109/ISCAS.2011.5937824
Wittmann, Juergen ; Wicht, Bernhard. / EMC influence of the charge pump in linear regulators - Design, simulation and measurements. 2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011. 2011. pp. 1359-1362 (Proceedings - IEEE International Symposium on Circuits and Systems).
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