EMC analysis of current source gate drivers

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

External Research Organisations

  • Reutlingen University
  • Infineon Technologies AG
  • Robert Bosch Centre for Power Electronics (RBZ)
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Details

Original languageEnglish
Title of host publicationEMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits
Pages101-106
Number of pages6
Publication statusPublished - 2013
Externally publishedYes
Event9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC COMPO 2013 - Nara, Japan
Duration: 15 Dec 201318 Dec 2013

Publication series

NameEMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits

Abstract

The prevention of electromagnetic emissions (EME) in bridge applications is of major importance, especially in automotive applications. Current source gate drivers are a popular approach to improve the performance in electromagnetic compatibility (EMC). Despites, their EMC performance has rarely been investigated in detail. Starting with the differences in the gate drive transients versus a conventional hard switching driver this paper presents a study regarding the EMC behavior. Different application cases are considered: Switching time, direction of load current, different load current levels. Experimental evaluation boards were prepared for both driver methods, results are provided for various cases. In order to identify the potential of current source gate drivers, the influence of the dv/dt and di/dt at bridge output were studied based on simulation. The di/dt turned out to be more important, a 5dBμV improved EMC was achieved by extending the duration of the current slope from 82ns to 92ns. The simulation setup also allowed to analyze the turn-on and turn-off transitions separately regarding EMC. Mainly due to the reverse recovery the turn-on transition gives 10dBμV worse EMC noise compared to turn-off. As an overall result, EMC improvements due to current source gate drivers in general are very case dependent.

ASJC Scopus subject areas

Cite this

EMC analysis of current source gate drivers. / Schindler, Alexis; Koeppl, Benno; Wicht, Bernhard.
EMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits. 2013. p. 101-106 6735181 (EMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Schindler, A, Koeppl, B & Wicht, B 2013, EMC analysis of current source gate drivers. in EMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits., 6735181, EMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, pp. 101-106, 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC COMPO 2013, Nara, Japan, 15 Dec 2013. https://doi.org/10.1109/EMCCompo.2013.6735181
Schindler, A., Koeppl, B., & Wicht, B. (2013). EMC analysis of current source gate drivers. In EMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (pp. 101-106). Article 6735181 (EMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits). https://doi.org/10.1109/EMCCompo.2013.6735181
Schindler A, Koeppl B, Wicht B. EMC analysis of current source gate drivers. In EMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits. 2013. p. 101-106. 6735181. (EMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits). doi: 10.1109/EMCCompo.2013.6735181
Schindler, Alexis ; Koeppl, Benno ; Wicht, Bernhard. / EMC analysis of current source gate drivers. EMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits. 2013. pp. 101-106 (EMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits).
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