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EffTE: A dependency-aware approach for test-driven ontology development

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • Lavdim Halilaj
  • Irlán Grangel-González
  • Steffen Lohmann
  • Maria Esther Vidal
  • Sören Auer

External Research Organisations

  • University of Bonn
  • Fraunhofer Institute for Intelligent Analysis and Information Systems (IAIS)
  • German National Library of Science and Technology (TIB)

Details

Original languageEnglish
Title of host publicationSAC '18
Subtitle of host publicationProceedings of the 33rd Annual ACM Symposium on Applied Computing
Place of PublicationNew York
PublisherAssociation for Computing Machinery (ACM)
Pages1976-1983
Number of pages8
ISBN (electronic)9781450351911
Publication statusPublished - 9 Apr 2018
Externally publishedYes
Event33rd Annual ACM Symposium on Applied Computing, SAC 2018 - Pau, France
Duration: 9 Apr 201813 Apr 2018

Publication series

NameProceedings of the ACM Symposium on Applied Computing

Keywords

    Dependency graph, Ontology engineering, Test cases, Test-driven ontology development

ASJC Scopus subject areas

Cite this

EffTE: A dependency-aware approach for test-driven ontology development. / Halilaj, Lavdim; Grangel-González, Irlán; Lohmann, Steffen et al.
SAC '18: Proceedings of the 33rd Annual ACM Symposium on Applied Computing. New York: Association for Computing Machinery (ACM), 2018. p. 1976-1983 (Proceedings of the ACM Symposium on Applied Computing).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Halilaj, L, Grangel-González, I, Lohmann, S, Vidal, ME & Auer, S 2018, EffTE: A dependency-aware approach for test-driven ontology development. in SAC '18: Proceedings of the 33rd Annual ACM Symposium on Applied Computing. Proceedings of the ACM Symposium on Applied Computing, Association for Computing Machinery (ACM), New York, pp. 1976-1983, 33rd Annual ACM Symposium on Applied Computing, SAC 2018, Pau, France, 9 Apr 2018. https://doi.org/10.1145/3167132.3167344
Halilaj, L., Grangel-González, I., Lohmann, S., Vidal, M. E., & Auer, S. (2018). EffTE: A dependency-aware approach for test-driven ontology development. In SAC '18: Proceedings of the 33rd Annual ACM Symposium on Applied Computing (pp. 1976-1983). (Proceedings of the ACM Symposium on Applied Computing). Association for Computing Machinery (ACM). https://doi.org/10.1145/3167132.3167344
Halilaj L, Grangel-González I, Lohmann S, Vidal ME, Auer S. EffTE: A dependency-aware approach for test-driven ontology development. In SAC '18: Proceedings of the 33rd Annual ACM Symposium on Applied Computing. New York: Association for Computing Machinery (ACM). 2018. p. 1976-1983. (Proceedings of the ACM Symposium on Applied Computing). doi: 10.1145/3167132.3167344
Halilaj, Lavdim ; Grangel-González, Irlán ; Lohmann, Steffen et al. / EffTE : A dependency-aware approach for test-driven ontology development. SAC '18: Proceedings of the 33rd Annual ACM Symposium on Applied Computing. New York : Association for Computing Machinery (ACM), 2018. pp. 1976-1983 (Proceedings of the ACM Symposium on Applied Computing).
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AU - Lohmann, Steffen

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