Details
| Original language | English |
|---|---|
| Article number | 192109 |
| Journal | Applied Physics Letters |
| Volume | 97 |
| Issue number | 19 |
| Publication status | Published - 11 Nov 2010 |
Abstract
Spin noise spectroscopy (SNS) is the perfect tool to investigate electron spin dynamics in semiconductors at thermal equilibrium. We simulate SNS measurements which utilize real-time fast Fourier transformation instead of an ordinary spectrum analyzer and show that ultrafast digitizers with low resolution enable surprisingly sensitive, high bandwidth SNS in the presence of strong optical background shot noise. The simulations reveal that optimized input load at the digitizer is crucial for efficient spin noise detection while the resolution of the digitizer, i.e., the bit depth, influences the sensitivity rather weakly.
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Physics and Astronomy (miscellaneous)
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In: Applied Physics Letters, Vol. 97, No. 19, 192109, 11.11.2010.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - Efficient data averaging for spin noise spectroscopy in semiconductors
AU - Müller, Georg M.
AU - Römer, Michael
AU - Hübner, Jens
AU - Oestreich, Michael
N1 - Funding information: The authors thank S. A. Crooker for helpful discussions. This work was supported by the German Science Foundation (DFG priority program 1285 “Semiconductor Spintronics”), the Federal Ministry for Education and Research (BMBF NanoQUIT), and the Centre for Quantum Engineering and Space-Time Research in Hannover (QUEST). G.M.M. acknowledges support from the Evangelisches Studienwerk.
PY - 2010/11/11
Y1 - 2010/11/11
N2 - Spin noise spectroscopy (SNS) is the perfect tool to investigate electron spin dynamics in semiconductors at thermal equilibrium. We simulate SNS measurements which utilize real-time fast Fourier transformation instead of an ordinary spectrum analyzer and show that ultrafast digitizers with low resolution enable surprisingly sensitive, high bandwidth SNS in the presence of strong optical background shot noise. The simulations reveal that optimized input load at the digitizer is crucial for efficient spin noise detection while the resolution of the digitizer, i.e., the bit depth, influences the sensitivity rather weakly.
AB - Spin noise spectroscopy (SNS) is the perfect tool to investigate electron spin dynamics in semiconductors at thermal equilibrium. We simulate SNS measurements which utilize real-time fast Fourier transformation instead of an ordinary spectrum analyzer and show that ultrafast digitizers with low resolution enable surprisingly sensitive, high bandwidth SNS in the presence of strong optical background shot noise. The simulations reveal that optimized input load at the digitizer is crucial for efficient spin noise detection while the resolution of the digitizer, i.e., the bit depth, influences the sensitivity rather weakly.
UR - http://www.scopus.com/inward/record.url?scp=78249267278&partnerID=8YFLogxK
U2 - 10.1063/1.3505342
DO - 10.1063/1.3505342
M3 - Article
AN - SCOPUS:78249267278
VL - 97
JO - Applied Physics Letters
JF - Applied Physics Letters
SN - 0003-6951
IS - 19
M1 - 192109
ER -