Details
| Original language | English |
|---|---|
| Title of host publication | Proceedings of the 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, EMC EUROPE 2020 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (electronic) | 9781728155791 |
| ISBN (print) | 978-1-7281-5578-4, 978-1-7281-5580-7 |
| Publication status | Published - 2020 |
| Event | 2020 International Symposium on Electromagnetic Compatibility: EMC EUROPE 2020 - Virtual, Rome, Italy Duration: 23 Sept 2020 → 25 Sept 2020 |
Abstract
Due to short traces inside a microcontroller (e.g. die, bond wires), the effects of coupled electromagnetic far fields below 1GHz can be neglected. For this reason, it can be assumed that a microcontroller is only influenced by conducted interference as long as these coupled-in far field interference signals are not higher than 1GHz. IEC62132-4 and IEC62215-3 describe the procedure for such examinations. In this work, the structure of a test board, which is required for the analysis of an 8-pin microcontroller, is described. In addition, a procedure is shown, how the corresponding peripheral circuits are designed and how the immunity of a microcontroller is determined. Finally, the question is clarified whether, based on the behavior of individual pins, conclusions can be drawn about all pins of the microcontroller.
Keywords
- conducted interference, IEMI, microcontroller, PCB design
ASJC Scopus subject areas
- Engineering(all)
- Electrical and Electronic Engineering
- Engineering(all)
- Safety, Risk, Reliability and Quality
- Physics and Astronomy(all)
- Radiation
- Computer Science(all)
- Computer Networks and Communications
- Computer Science(all)
- Hardware and Architecture
- Engineering(all)
- Aerospace Engineering
Cite this
- Standard
- Harvard
- Apa
- Vancouver
- BibTeX
- RIS
Proceedings of the 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, EMC EUROPE 2020. Institute of Electrical and Electronics Engineers Inc., 2020. 9245782.
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Effects of Conducted Interference on a Microcontroller Based on IEC 62132-4 and IEC 62215-3
AU - Burghardt, Felix
AU - Garbe, Heyno
N1 - Funding Information: The results shown in this paper were partly produced with the support of the Bundeswehr Research Institute for Protective Technologies – NBC-Protection in Munster, Germany. Contract Number E/E590/15440/HF112
PY - 2020
Y1 - 2020
N2 - Due to short traces inside a microcontroller (e.g. die, bond wires), the effects of coupled electromagnetic far fields below 1GHz can be neglected. For this reason, it can be assumed that a microcontroller is only influenced by conducted interference as long as these coupled-in far field interference signals are not higher than 1GHz. IEC62132-4 and IEC62215-3 describe the procedure for such examinations. In this work, the structure of a test board, which is required for the analysis of an 8-pin microcontroller, is described. In addition, a procedure is shown, how the corresponding peripheral circuits are designed and how the immunity of a microcontroller is determined. Finally, the question is clarified whether, based on the behavior of individual pins, conclusions can be drawn about all pins of the microcontroller.
AB - Due to short traces inside a microcontroller (e.g. die, bond wires), the effects of coupled electromagnetic far fields below 1GHz can be neglected. For this reason, it can be assumed that a microcontroller is only influenced by conducted interference as long as these coupled-in far field interference signals are not higher than 1GHz. IEC62132-4 and IEC62215-3 describe the procedure for such examinations. In this work, the structure of a test board, which is required for the analysis of an 8-pin microcontroller, is described. In addition, a procedure is shown, how the corresponding peripheral circuits are designed and how the immunity of a microcontroller is determined. Finally, the question is clarified whether, based on the behavior of individual pins, conclusions can be drawn about all pins of the microcontroller.
KW - conducted interference
KW - IEMI
KW - microcontroller
KW - PCB design
UR - http://www.scopus.com/inward/record.url?scp=85097190893&partnerID=8YFLogxK
U2 - 10.1109/EMCEUROPE48519.2020.9245782
DO - 10.1109/EMCEUROPE48519.2020.9245782
M3 - Conference contribution
AN - SCOPUS:85097190893
SN - 978-1-7281-5578-4
SN - 978-1-7281-5580-7
BT - Proceedings of the 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, EMC EUROPE 2020
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2020 International Symposium on Electromagnetic Compatibility
Y2 - 23 September 2020 through 25 September 2020
ER -