Dynamic Characterization of a SiC-MOSFET Half Bridge in Hard- And Soft-Switching and Investigation of Current Sensing Technologies

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • Janine Ebersberger
  • Jan Kaspar Muller
  • Axel Mertens

External Research Organisations

  • Cluster of Excellence SE²A Sustainable and Energy-Efficient Aviation
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Details

Original languageEnglish
Title of host publication2020 22nd European Conference on Power Electronics and Applications, EPE 2020 ECCE Europe
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (electronic)9789075815368
ISBN (print)978-1-7281-9807-1
Publication statusPublished - 2020
Event22nd European Conference on Power Electronics and Applications, EPE 2020 ECCE Europe - Lyon, France
Duration: 7 Sept 202011 Sept 2020

Abstract

In this paper, the dynamic characterization of a 1.2 kV SiC-MOSFET half bridge module is presented. At first, the switching behaviour of the MOSFET and its body diode is examined with a double pulse test, also targeting the evaluation of the used current sensing technologies. Afterwards, the soft-switching performance is investigated in a three-phase inverter configuration with a sine-wave output filter.

Keywords

    Current sensor, Double pulse test, Silicon Carbide (SiC), Soft switching, Wide bandgap devices

ASJC Scopus subject areas

Cite this

Dynamic Characterization of a SiC-MOSFET Half Bridge in Hard- And Soft-Switching and Investigation of Current Sensing Technologies. / Ebersberger, Janine; Muller, Jan Kaspar; Mertens, Axel.
2020 22nd European Conference on Power Electronics and Applications, EPE 2020 ECCE Europe. Institute of Electrical and Electronics Engineers Inc., 2020. 9215599.

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Ebersberger, J, Muller, JK & Mertens, A 2020, Dynamic Characterization of a SiC-MOSFET Half Bridge in Hard- And Soft-Switching and Investigation of Current Sensing Technologies. in 2020 22nd European Conference on Power Electronics and Applications, EPE 2020 ECCE Europe., 9215599, Institute of Electrical and Electronics Engineers Inc., 22nd European Conference on Power Electronics and Applications, EPE 2020 ECCE Europe, Lyon, France, 7 Sept 2020. https://doi.org/10.23919/EPE20ECCEEurope43536.2020.9215599
Ebersberger, J., Muller, J. K., & Mertens, A. (2020). Dynamic Characterization of a SiC-MOSFET Half Bridge in Hard- And Soft-Switching and Investigation of Current Sensing Technologies. In 2020 22nd European Conference on Power Electronics and Applications, EPE 2020 ECCE Europe Article 9215599 Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/EPE20ECCEEurope43536.2020.9215599
Ebersberger J, Muller JK, Mertens A. Dynamic Characterization of a SiC-MOSFET Half Bridge in Hard- And Soft-Switching and Investigation of Current Sensing Technologies. In 2020 22nd European Conference on Power Electronics and Applications, EPE 2020 ECCE Europe. Institute of Electrical and Electronics Engineers Inc. 2020. 9215599 doi: 10.23919/EPE20ECCEEurope43536.2020.9215599
Ebersberger, Janine ; Muller, Jan Kaspar ; Mertens, Axel. / Dynamic Characterization of a SiC-MOSFET Half Bridge in Hard- And Soft-Switching and Investigation of Current Sensing Technologies. 2020 22nd European Conference on Power Electronics and Applications, EPE 2020 ECCE Europe. Institute of Electrical and Electronics Engineers Inc., 2020.
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