Dual wavelength ultra-short pulse laser damage testing

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • Mark Gyamfi
  • Peter Jürgens
  • Mathias Mende
  • Lars Jensen
  • Detlev Ristau

External Research Organisations

  • Laser Zentrum Hannover e.V. (LZH)
  • Laseroptik GmbH
View graph of relations

Details

Original languageEnglish
Title of host publication46th Annual Laser Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials
Subtitle of host publication2014
PublisherSPIE
ISBN (electronic)9781628413007
Publication statusPublished - 15 Nov 2014
Externally publishedYes
Event46th Annual Laser Damage Symposium - Laser-Induced Damage in Optical Materials: 2014 - Boulder, United States
Duration: 14 Sept 201417 Sept 2014

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9237
ISSN (Print)0277-786X
ISSN (electronic)1996-756X

Abstract

In the femtosecond regime laser damage thresholds are often determined by the electric field distribution within the optical component. Commercially available ultra-short pulse laser systems provide ever increasing output powers in fundamental and harmonic wavelengths. Therefore, an increasing demand for frequency conversion or multiwavelengths optics with high damage thresholds for both, fundamental and second harmonic wavelengths is given. These optics are under increased strain and face even more design difficulties. Also, the electric field distribution is of higher complexity and favors multi-photon excitation of high efficiencies. We investigate the LIDT of dichroic high reflecting mirrors under simultaneous exposure to fundamental and second harmonic radiation. As laser source we use a Ti: Sa system delivering sub 200 fs pulses at 780nm/390nm. A delay-line was incorporated to ensure temporal overlap of the 2 pulses in the test plane. Further, the LIDT of a single layer of Ta2O5 under irradiation with fundamental and second harmonic radiation is calculated and results are compared with our experiment.

Keywords

    Dual wavelength, Fs-LIDT, Ultra-short pulse damage

ASJC Scopus subject areas

Cite this

Dual wavelength ultra-short pulse laser damage testing. / Gyamfi, Mark; Jürgens, Peter; Mende, Mathias et al.
46th Annual Laser Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials: 2014. SPIE, 2014. 92371Q (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9237).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Gyamfi, M, Jürgens, P, Mende, M, Jensen, L & Ristau, D 2014, Dual wavelength ultra-short pulse laser damage testing. in 46th Annual Laser Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials: 2014., 92371Q, Proceedings of SPIE - The International Society for Optical Engineering, vol. 9237, SPIE, 46th Annual Laser Damage Symposium - Laser-Induced Damage in Optical Materials: 2014, Boulder, United States, 14 Sept 2014. https://doi.org/10.1117/12.2068180
Gyamfi, M., Jürgens, P., Mende, M., Jensen, L., & Ristau, D. (2014). Dual wavelength ultra-short pulse laser damage testing. In 46th Annual Laser Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials: 2014 Article 92371Q (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9237). SPIE. https://doi.org/10.1117/12.2068180
Gyamfi M, Jürgens P, Mende M, Jensen L, Ristau D. Dual wavelength ultra-short pulse laser damage testing. In 46th Annual Laser Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials: 2014. SPIE. 2014. 92371Q. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.2068180
Gyamfi, Mark ; Jürgens, Peter ; Mende, Mathias et al. / Dual wavelength ultra-short pulse laser damage testing. 46th Annual Laser Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials: 2014. SPIE, 2014. (Proceedings of SPIE - The International Society for Optical Engineering).
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