Diode laser modules of highest brilliance for materials processing

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • Alexander Knitsch
  • Axel Luft
  • Tobias Groß
  • Detlev Ristau
  • Peter Loosen
  • Reinhart Poprawe

External Research Organisations

  • Fraunhofer Institute for Laser Technology (ILT)
  • Thyssenkrupp Automation Engineering GmbH
  • Laser Zentrum Hannover e.V. (LZH)
View graph of relations

Details

Original languageEnglish
Title of host publicationNovel In-Plane Semiconductor Lasers
Subtitle of host publication21 - 23 January 2002, San Jose, USA
Place of PublicationBellingham
PublisherSPIE
Pages256-263
Number of pages8
Edition1
ISBN (print)0-8194-4390-5
Publication statusPublished - 22 May 2002
Externally publishedYes

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Volume4651
ISSN (Print)0277-786X

Abstract

Beam quality and output power of mostly 2-dimensional stacked diode laser systems are insufficient for the demands of materials processing. To increase the output power at almost constant beam-quality, superimposition of diode laser bars of different wavelengths as well as polarization-multiplexing of s- and p-polarized laser beams is possible. Different techniques for wavelength-multiplexing have been developed. The so-called multi-filter concept of a spanned coated etalon with edge-filters has turned out best. The concept features a modular design, simple adjustment and easy add-on of more wavelengths. Concerning the polarization-multiplexing we take advantage of the almost linear polarized diode laser bars. Ordinary used beam splitter cubes with a cemented structure are less qualified for high radiance. Hence the beam combination is achieved with beam displacers made of a birefringent crystal (YVO4) which provide high transmittance and convenient adaptation. Finally an experimental set-up with 8 diode laser bars of 4 different wavelengths, i.e. 8-times beam superimposition, is realized. The set-up called multiplexer obtains a radiance of about 4 × 106 W cm-2 sr-1 and outnumbers all other comparable high power diode laser systems.

Keywords

    Beam displacer, Birefringent crystal, High power diode laser, Multi-filter, Multiplexer, Polarization-multiplexing, Wavelength-multiplexing

ASJC Scopus subject areas

Cite this

Diode laser modules of highest brilliance for materials processing. / Knitsch, Alexander; Luft, Axel; Groß, Tobias et al.
Novel In-Plane Semiconductor Lasers: 21 - 23 January 2002, San Jose, USA. 1. ed. Bellingham: SPIE, 2002. p. 256-263 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 4651).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Knitsch, A, Luft, A, Groß, T, Ristau, D, Loosen, P & Poprawe, R 2002, Diode laser modules of highest brilliance for materials processing. in Novel In-Plane Semiconductor Lasers: 21 - 23 January 2002, San Jose, USA. 1 edn, Proceedings of SPIE - The International Society for Optical Engineering, vol. 4651, SPIE, Bellingham, pp. 256-263. https://doi.org/10.1117/12.467954
Knitsch, A., Luft, A., Groß, T., Ristau, D., Loosen, P., & Poprawe, R. (2002). Diode laser modules of highest brilliance for materials processing. In Novel In-Plane Semiconductor Lasers: 21 - 23 January 2002, San Jose, USA (1 ed., pp. 256-263). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 4651). SPIE. https://doi.org/10.1117/12.467954
Knitsch A, Luft A, Groß T, Ristau D, Loosen P, Poprawe R. Diode laser modules of highest brilliance for materials processing. In Novel In-Plane Semiconductor Lasers: 21 - 23 January 2002, San Jose, USA. 1 ed. Bellingham: SPIE. 2002. p. 256-263. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.467954
Knitsch, Alexander ; Luft, Axel ; Groß, Tobias et al. / Diode laser modules of highest brilliance for materials processing. Novel In-Plane Semiconductor Lasers: 21 - 23 January 2002, San Jose, USA. 1. ed. Bellingham : SPIE, 2002. pp. 256-263 (Proceedings of SPIE - The International Society for Optical Engineering).
Download
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