Details
| Original language | English |
|---|---|
| Pages (from-to) | 33-40 |
| Number of pages | 8 |
| Journal | IEEE Expert-Intelligent Systems and their Applications |
| Volume | 8 |
| Issue number | 1 |
| Publication status | Published - Feb 1993 |
| Externally published | Yes |
ASJC Scopus subject areas
- Engineering(all)
- General Engineering
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Diamon: A Model-Based Troubleshooter Based on Qualitative Reasoning. / Lackinger, Franz; Nejdl, Wolfgang.
In: IEEE Expert-Intelligent Systems and their Applications, Vol. 8, No. 1, 02.1993, p. 33-40.
In: IEEE Expert-Intelligent Systems and their Applications, Vol. 8, No. 1, 02.1993, p. 33-40.
Research output: Contribution to journal › Article › Research › peer review
Lackinger, F & Nejdl, W 1993, 'Diamon: A Model-Based Troubleshooter Based on Qualitative Reasoning', IEEE Expert-Intelligent Systems and their Applications, vol. 8, no. 1, pp. 33-40. https://doi.org/10.1109/64.193053
Lackinger F, Nejdl W. Diamon: A Model-Based Troubleshooter Based on Qualitative Reasoning. IEEE Expert-Intelligent Systems and their Applications. 1993 Feb;8(1):33-40. doi: 10.1109/64.193053
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@article{288ada128b8e4a2e9ade86f6d63053c7,
title = "Diamon: A Model-Based Troubleshooter Based on Qualitative Reasoning",
author = "Franz Lackinger and Wolfgang Nejdl",
year = "1993",
month = feb,
doi = "10.1109/64.193053",
language = "English",
volume = "8",
pages = "33--40",
journal = "IEEE Expert-Intelligent Systems and their Applications",
issn = "0885-9000",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "1",
}
Download
TY - JOUR
T1 - Diamon
T2 - A Model-Based Troubleshooter Based on Qualitative Reasoning
AU - Lackinger, Franz
AU - Nejdl, Wolfgang
PY - 1993/2
Y1 - 1993/2
UR - http://www.scopus.com/inward/record.url?scp=0001780071&partnerID=8YFLogxK
U2 - 10.1109/64.193053
DO - 10.1109/64.193053
M3 - Article
AN - SCOPUS:0001780071
VL - 8
SP - 33
EP - 40
JO - IEEE Expert-Intelligent Systems and their Applications
JF - IEEE Expert-Intelligent Systems and their Applications
SN - 0885-9000
IS - 1
ER -