Details
| Original language | English |
|---|---|
| Title of host publication | Optical Measurement Systems for Industrial Inspection IX |
| Editors | Armando Albertazzi G., Peter Lehmann, Wolfgang Osten |
| Publisher | SPIE |
| Number of pages | 7 |
| ISBN (electronic) | 9781628416855 |
| Publication status | Published - 22 Jun 2015 |
| Event | Optical Measurement Systems for Industrial Inspection IX - Munich, Germany Duration: 22 Jun 2015 → 25 Jun 2015 |
Publication series
| Name | Proceedings of SPIE - The International Society for Optical Engineering |
|---|---|
| Volume | 9525 |
| ISSN (Print) | 0277-786X |
| ISSN (electronic) | 1996-756X |
Abstract
Vertical scanning interferometry (VSI) techniques are widely used to profile microscopic surface structures of industrial products. This paper introduces a high-precision fast optical measurement system with an optimized small sensor head for the measurement of precision surfaces on a turbine blade or blisks (blade integrated discs). The non-contact measurement system is based on a low coherence interferometer (LCI), which is capable of fast profiling of 3D sample surface with a nanometer resolution and has a larger measurement range compared to conventional microscopes. This results in a large amount of sampled data and a high computational time for the evaluation of the data. For this reason, the used evaluation algorithm in this paper is accelerated by the Compute Unified Device Architecture (CUDA) technology, which allows parallel evaluation of the data stack on independent cores of a General Purpose Graphics Processing Unit (GPGPU). As a result, the GPU-based optimized algorithm is compared with the original CPU-based single-threaded algorithm to show the approximate 60x speedup of computing the Hilbert Transformation, which is used to find the depth position in the correlogram of each pixel of the sampled data. The main advantage of the GPU computing for the evaluation algorithm of the LCI is that it can reduce the time-consuming data evaluation process and further accelerates the whole measurement.
Keywords
- CUDA, Interferometer, Low coherence interferometry, Non-contact measurement system
ASJC Scopus subject areas
- Materials Science(all)
- Electronic, Optical and Magnetic Materials
- Physics and Astronomy(all)
- Condensed Matter Physics
- Computer Science(all)
- Computer Science Applications
- Mathematics(all)
- Applied Mathematics
- Engineering(all)
- Electrical and Electronic Engineering
Cite this
- Standard
- Harvard
- Apa
- Vancouver
- BibTeX
- RIS
Optical Measurement Systems for Industrial Inspection IX. ed. / Armando Albertazzi G.; Peter Lehmann; Wolfgang Osten. SPIE, 2015. 95250R (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9525).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Development of a compact low coherence interferometer based on GPGPU for fast microscopic surface measurement on turbine blades
AU - Li, Yinan
AU - Kästner, Markus
AU - Reithmeier, Eduard
PY - 2015/6/22
Y1 - 2015/6/22
N2 - Vertical scanning interferometry (VSI) techniques are widely used to profile microscopic surface structures of industrial products. This paper introduces a high-precision fast optical measurement system with an optimized small sensor head for the measurement of precision surfaces on a turbine blade or blisks (blade integrated discs). The non-contact measurement system is based on a low coherence interferometer (LCI), which is capable of fast profiling of 3D sample surface with a nanometer resolution and has a larger measurement range compared to conventional microscopes. This results in a large amount of sampled data and a high computational time for the evaluation of the data. For this reason, the used evaluation algorithm in this paper is accelerated by the Compute Unified Device Architecture (CUDA) technology, which allows parallel evaluation of the data stack on independent cores of a General Purpose Graphics Processing Unit (GPGPU). As a result, the GPU-based optimized algorithm is compared with the original CPU-based single-threaded algorithm to show the approximate 60x speedup of computing the Hilbert Transformation, which is used to find the depth position in the correlogram of each pixel of the sampled data. The main advantage of the GPU computing for the evaluation algorithm of the LCI is that it can reduce the time-consuming data evaluation process and further accelerates the whole measurement.
AB - Vertical scanning interferometry (VSI) techniques are widely used to profile microscopic surface structures of industrial products. This paper introduces a high-precision fast optical measurement system with an optimized small sensor head for the measurement of precision surfaces on a turbine blade or blisks (blade integrated discs). The non-contact measurement system is based on a low coherence interferometer (LCI), which is capable of fast profiling of 3D sample surface with a nanometer resolution and has a larger measurement range compared to conventional microscopes. This results in a large amount of sampled data and a high computational time for the evaluation of the data. For this reason, the used evaluation algorithm in this paper is accelerated by the Compute Unified Device Architecture (CUDA) technology, which allows parallel evaluation of the data stack on independent cores of a General Purpose Graphics Processing Unit (GPGPU). As a result, the GPU-based optimized algorithm is compared with the original CPU-based single-threaded algorithm to show the approximate 60x speedup of computing the Hilbert Transformation, which is used to find the depth position in the correlogram of each pixel of the sampled data. The main advantage of the GPU computing for the evaluation algorithm of the LCI is that it can reduce the time-consuming data evaluation process and further accelerates the whole measurement.
KW - CUDA
KW - Interferometer
KW - Low coherence interferometry
KW - Non-contact measurement system
UR - http://www.scopus.com/inward/record.url?scp=84954048112&partnerID=8YFLogxK
U2 - 10.1117/12.2184749
DO - 10.1117/12.2184749
M3 - Conference contribution
AN - SCOPUS:84954048112
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Optical Measurement Systems for Industrial Inspection IX
A2 - Albertazzi G., Armando
A2 - Lehmann, Peter
A2 - Osten, Wolfgang
PB - SPIE
T2 - Optical Measurement Systems for Industrial Inspection IX
Y2 - 22 June 2015 through 25 June 2015
ER -