Determination of the propagation constant of coupled lines on chips based on high frequency measurements

Research output: Contribution to conference › Paper › Research › peer review

Authors

  • Thomas Michael Winkel
  • Lohit Sagar Dutta
  • Hartmut Grabinski
  • Enno Grotelueschen

Research Organisations

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Details

Original languageEnglish
Pages99-104
Number of pages6
Publication statusPublished - 1996
Event1996 IEEE Multi-Chip Module Conference - Santa Cruz, United States
Duration: 6 Feb 1996 → 7 Feb 1996

Conference

Conference1996 IEEE Multi-Chip Module Conference
Country/TerritoryUnited States
CitySanta Cruz
Period6 Feb 1996 → 7 Feb 1996

Abstract

A new method has been developed to determine the propagation constant of symmetrical coupled lossy lines. The results are based on high frequency measurements of the scattering parameters of only two coupled two line systems of different lengths. The mathematical derivation of the method will be given. The proposed method is related to an eigenvalue calculation. Results obtained from measurements will be presented and discussed. A comparison between the measured and calculated results is given and shows excellent agreement.

ASJC Scopus subject areas

Cite this

Determination of the propagation constant of coupled lines on chips based on high frequency measurements. / Winkel, Thomas Michael; Sagar Dutta, Lohit; Grabinski, Hartmut et al.
1996. 99-104 Paper presented at 1996 IEEE Multi-Chip Module Conference, Santa Cruz, California, United States.

Research output: Contribution to conference › Paper › Research › peer review

Winkel, TM, Sagar Dutta, L, Grabinski, H & Grotelueschen, E 1996, 'Determination of the propagation constant of coupled lines on chips based on high frequency measurements', Paper presented at 1996 IEEE Multi-Chip Module Conference, Santa Cruz, United States, 6 Feb 1996 - 7 Feb 1996 pp. 99-104. https://doi.org/10.1109/MCMC.1996.510777
Winkel, T. M., Sagar Dutta, L., Grabinski, H., & Grotelueschen, E. (1996). Determination of the propagation constant of coupled lines on chips based on high frequency measurements. 99-104. Paper presented at 1996 IEEE Multi-Chip Module Conference, Santa Cruz, California, United States. https://doi.org/10.1109/MCMC.1996.510777
Winkel TM, Sagar Dutta L, Grabinski H, Grotelueschen E. Determination of the propagation constant of coupled lines on chips based on high frequency measurements. 1996. Paper presented at 1996 IEEE Multi-Chip Module Conference, Santa Cruz, California, United States. doi: 10.1109/MCMC.1996.510777
Winkel, Thomas Michael ; Sagar Dutta, Lohit ; Grabinski, Hartmut et al. / Determination of the propagation constant of coupled lines on chips based on high frequency measurements. Paper presented at 1996 IEEE Multi-Chip Module Conference, Santa Cruz, California, United States.6 p.
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AB - A new method has been developed to determine the propagation constant of symmetrical coupled lossy lines. The results are based on high frequency measurements of the scattering parameters of only two coupled two line systems of different lengths. The mathematical derivation of the method will be given. The proposed method is related to an eigenvalue calculation. Results obtained from measurements will be presented and discussed. A comparison between the measured and calculated results is given and shows excellent agreement.

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