Detecting linear features by spatial point processes

Research output: Contribution to journalConference articleResearchpeer review

Authors

  • Dengfeng Chai
  • Alena Schmidt
  • Christian Heipke

External Research Organisations

  • Zhejiang University
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Details

Original languageEnglish
Pages (from-to)841-848
Number of pages8
JournalInternational Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences - ISPRS Archives
VolumeXLI-B3
Publication statusPublished - 10 Jun 2016
Event23rd International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences Congress, ISPRS 2016 - Prague, Czech Republic
Duration: 12 Jul 201619 Jul 2016

Abstract

This paper proposes a novel approach for linear feature detection. The contribution is twofold: A novel model for spatial point processes and a new method for linear feature detection. It describes a linear feature as a string of points, represents all features in an image as a configuration of a spatial point process, and formulates feature detection as finding the optimal configuration of a spatial point process. Further, a prior term is proposed to favor straight linear configurations, and a data term is constructed to superpose the points on linear features. The proposed approach extracts straight linear features in a global framework. The paper reports ongoing work. As demonstrated in preliminary experiments, globally optimal linear features can be detected.

Keywords

    Feature Detection, Global Optimization, Linear Feature, Markov Chain Monte Carlo, Simulated Annealing, Spatial Point Processes

ASJC Scopus subject areas

Cite this

Detecting linear features by spatial point processes. / Chai, Dengfeng; Schmidt, Alena; Heipke, Christian.
In: International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences - ISPRS Archives, Vol. XLI-B3, 10.06.2016, p. 841-848.

Research output: Contribution to journalConference articleResearchpeer review

Chai, D, Schmidt, A & Heipke, C 2016, 'Detecting linear features by spatial point processes', International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences - ISPRS Archives, vol. XLI-B3, pp. 841-848. https://doi.org/10.5194/isprs-archives-XLI-B3-841-2016, https://doi.org/10.15488/700
Chai, D., Schmidt, A., & Heipke, C. (2016). Detecting linear features by spatial point processes. International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences - ISPRS Archives, XLI-B3, 841-848. https://doi.org/10.5194/isprs-archives-XLI-B3-841-2016, https://doi.org/10.15488/700
Chai D, Schmidt A, Heipke C. Detecting linear features by spatial point processes. International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences - ISPRS Archives. 2016 Jun 10;XLI-B3:841-848. doi: 10.5194/isprs-archives-XLI-B3-841-2016, 10.15488/700
Chai, Dengfeng ; Schmidt, Alena ; Heipke, Christian. / Detecting linear features by spatial point processes. In: International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences - ISPRS Archives. 2016 ; Vol. XLI-B3. pp. 841-848.
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