Deep ultraviolet spectral photometry investigation of optical components under vacuum and nitrogen purge conditions

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • P. Kadkhoda
  • P. R. Baddipaduga
  • F. Carstens
  • A. Wienke
  • D. Ristau

Research Organisations

External Research Organisations

  • Laser Zentrum Hannover e.V. (LZH)
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Details

Original languageEnglish
Title of host publicationOptical Fabrication and Testing VIII
EditorsEric Ruch, Reinhard Volkel
PublisherSPIE
Number of pages8
ISBN (electronic)9781510673601
Publication statusPublished - 17 Jun 2024
EventOptical Fabrication and Testing VIII 2024 - Strasbourg, France
Duration: 8 Apr 202410 Apr 2024

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume13021
ISSN (Print)0277-786X
ISSN (electronic)1996-756X

Abstract

For future development of components for the DUV/VUV spectral range, the precise knowledge of the optical transfer functions such as spectral transmission or reflection are essential. Due to the strong atmospheric absorption of radiation in this range, spectral measurements must be carried out in the absence of oxygen. Tests are usually performed in vacuum or by purging the spectrometer with an inert gas. In vacuum environment, often a radiation induced formation of hydrocarbon contaminants on the surface of the optic is observed, that deteriorates the optical functioning and leads to erroneous measurement results. We report in this article on spectrometry tests under vacuum and purge conditions and compare the results for both environmental conditions. To avoid the contamination of the optics tests were carried out in the DUV spectral range under nitrogen purging. N2 itself shows vibrational and rotational molecular absorption bands in the wavelength range from 110 nm to 150 nm, which are present as peaks with arbitrary amplitudes in the spectrometry results. Several time domain parameters such as integration time, integration range, power monitoring aspects, and frequency bandwidth of the data acquisition modules of the spectrometer are studied to investigate the origin of the disturbing peaks. Also, different polarization states of the radiation, angle resolved scattering and pressure variation of nitrogen gas are considered to adapt the test procedures for managing the presence of these absorption lines in the measured data and to obtain reliable results.

Keywords

    DUV/VUV spectrometry, ISO 15368, Molecular absorption bands, Nitrogen purge

ASJC Scopus subject areas

Cite this

Deep ultraviolet spectral photometry investigation of optical components under vacuum and nitrogen purge conditions. / Kadkhoda, P.; Baddipaduga, P. R.; Carstens, F. et al.
Optical Fabrication and Testing VIII. ed. / Eric Ruch; Reinhard Volkel. SPIE, 2024. 130210I (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 13021).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Kadkhoda, P, Baddipaduga, PR, Carstens, F, Wienke, A & Ristau, D 2024, Deep ultraviolet spectral photometry investigation of optical components under vacuum and nitrogen purge conditions. in E Ruch & R Volkel (eds), Optical Fabrication and Testing VIII., 130210I, Proceedings of SPIE - The International Society for Optical Engineering, vol. 13021, SPIE, Optical Fabrication and Testing VIII 2024, Strasbourg, France, 8 Apr 2024. https://doi.org/10.1117/12.3021963
Kadkhoda, P., Baddipaduga, P. R., Carstens, F., Wienke, A., & Ristau, D. (2024). Deep ultraviolet spectral photometry investigation of optical components under vacuum and nitrogen purge conditions. In E. Ruch, & R. Volkel (Eds.), Optical Fabrication and Testing VIII Article 130210I (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 13021). SPIE. https://doi.org/10.1117/12.3021963
Kadkhoda P, Baddipaduga PR, Carstens F, Wienke A, Ristau D. Deep ultraviolet spectral photometry investigation of optical components under vacuum and nitrogen purge conditions. In Ruch E, Volkel R, editors, Optical Fabrication and Testing VIII. SPIE. 2024. 130210I. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.3021963
Kadkhoda, P. ; Baddipaduga, P. R. ; Carstens, F. et al. / Deep ultraviolet spectral photometry investigation of optical components under vacuum and nitrogen purge conditions. Optical Fabrication and Testing VIII. editor / Eric Ruch ; Reinhard Volkel. SPIE, 2024. (Proceedings of SPIE - The International Society for Optical Engineering).
Download
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