Critical review of converting spectral data into prospective bit error rates

Research output: Contribution to journalConference articleResearchpeer review

Authors

  • Axel Knobloch
  • Heyno Garbe
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Details

Original languageEnglish
Pages (from-to)173-178
Number of pages6
JournalIEEE International Symposium on Electromagnetic Compatibility
Volume1
Publication statusPublished - 2002
Event2002 IEEE International Symposium on Electromagnetic Compatibility - Minneapolis, MN, United States
Duration: 19 Aug 200223 Aug 2002

Abstract

This paper gives an overview of methods to convert electromagnetic interference for bandpass signals into bit error rates (BER). The different influence parameters are discussed and two possible interference detectors corresponding to bit error rate (weighting detector and an amplitude probability distribution measurement) are described. The use of a pulsed sine-wave as an interference signal is discussed. Examples are given for the modulation scheme minimum shift keying (MSK).

Keywords

    Bit error rate, Digital system, Interference, Weighting detector

ASJC Scopus subject areas

Cite this

Critical review of converting spectral data into prospective bit error rates. / Knobloch, Axel; Garbe, Heyno.
In: IEEE International Symposium on Electromagnetic Compatibility, Vol. 1, 2002, p. 173-178.

Research output: Contribution to journalConference articleResearchpeer review

Knobloch, A & Garbe, H 2002, 'Critical review of converting spectral data into prospective bit error rates', IEEE International Symposium on Electromagnetic Compatibility, vol. 1, pp. 173-178.
Knobloch, A., & Garbe, H. (2002). Critical review of converting spectral data into prospective bit error rates. IEEE International Symposium on Electromagnetic Compatibility, 1, 173-178.
Knobloch A, Garbe H. Critical review of converting spectral data into prospective bit error rates. IEEE International Symposium on Electromagnetic Compatibility. 2002;1:173-178.
Knobloch, Axel ; Garbe, Heyno. / Critical review of converting spectral data into prospective bit error rates. In: IEEE International Symposium on Electromagnetic Compatibility. 2002 ; Vol. 1. pp. 173-178.
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