Details
| Original language | English |
|---|---|
| Pages (from-to) | 1592-1598 |
| Number of pages | 7 |
| Journal | Advances in Science, Technology and Engineering Systems |
| Volume | 2 |
| Issue number | 3 |
| Publication status | Published - 2017 |
Abstract
Radiation hardened devices are mostly extremely expensive. The continuously downscaling of microelectronic structures and the unavoidable presence of particle radiation on ground and in space leads to unwanted failures in electronic devices. Furthermore it is expected that in the next few years around 8000 new satellites will be launched around the world. Due to the enormous increasing need for Rad-Hard devices, there will be more focus on Commercial Of The Shelf (COTS) devices, which costs are lower. Also nowadays microelectronics for automotive systems are tested to withstand radiation especially SEU-single event upsets. It is clear that SEU cannot be ignored anymore especially in the application of unmanned autonomous vehicles and systems. Reliability testing is expensive and extremely time consuming. The use of COTS-Commercials of the shelf is the ultimate goal to reach. In this paper, an overview of radiation effects on different CMOS technologies used in COTS devices is given. These effects can be considered while selecting different functional equivalent COTS devices implemented with different technologies. Moreover, an overview of software techniques used in programmable commercial devices to reduce the radiation effects is also described.
Keywords
- Circuit, Metallization, Migration, Packaging, Radiation, Reliability, Simulation, SRAM
ASJC Scopus subject areas
- Engineering(all)
- Engineering (miscellaneous)
- Physics and Astronomy(all)
- Physics and Astronomy (miscellaneous)
- Business, Management and Accounting(all)
- Management of Technology and Innovation
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In: Advances in Science, Technology and Engineering Systems, Vol. 2, No. 3, 2017, p. 1592-1598.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - COTS - Harsh condition effects considerations from technology to user level
AU - Weide-Zaage, Kirsten
AU - Payá-Vayá, Guillermo
N1 - Publisher Copyright: © 2017 ASTES Publishers. All rights reserved. Copyright: Copyright 2019 Elsevier B.V., All rights reserved.
PY - 2017
Y1 - 2017
N2 - Radiation hardened devices are mostly extremely expensive. The continuously downscaling of microelectronic structures and the unavoidable presence of particle radiation on ground and in space leads to unwanted failures in electronic devices. Furthermore it is expected that in the next few years around 8000 new satellites will be launched around the world. Due to the enormous increasing need for Rad-Hard devices, there will be more focus on Commercial Of The Shelf (COTS) devices, which costs are lower. Also nowadays microelectronics for automotive systems are tested to withstand radiation especially SEU-single event upsets. It is clear that SEU cannot be ignored anymore especially in the application of unmanned autonomous vehicles and systems. Reliability testing is expensive and extremely time consuming. The use of COTS-Commercials of the shelf is the ultimate goal to reach. In this paper, an overview of radiation effects on different CMOS technologies used in COTS devices is given. These effects can be considered while selecting different functional equivalent COTS devices implemented with different technologies. Moreover, an overview of software techniques used in programmable commercial devices to reduce the radiation effects is also described.
AB - Radiation hardened devices are mostly extremely expensive. The continuously downscaling of microelectronic structures and the unavoidable presence of particle radiation on ground and in space leads to unwanted failures in electronic devices. Furthermore it is expected that in the next few years around 8000 new satellites will be launched around the world. Due to the enormous increasing need for Rad-Hard devices, there will be more focus on Commercial Of The Shelf (COTS) devices, which costs are lower. Also nowadays microelectronics for automotive systems are tested to withstand radiation especially SEU-single event upsets. It is clear that SEU cannot be ignored anymore especially in the application of unmanned autonomous vehicles and systems. Reliability testing is expensive and extremely time consuming. The use of COTS-Commercials of the shelf is the ultimate goal to reach. In this paper, an overview of radiation effects on different CMOS technologies used in COTS devices is given. These effects can be considered while selecting different functional equivalent COTS devices implemented with different technologies. Moreover, an overview of software techniques used in programmable commercial devices to reduce the radiation effects is also described.
KW - Circuit
KW - Metallization
KW - Migration
KW - Packaging
KW - Radiation
KW - Reliability
KW - Simulation
KW - SRAM
UR - http://www.scopus.com/inward/record.url?scp=85069202348&partnerID=8YFLogxK
U2 - 10.25046/aj0203198
DO - 10.25046/aj0203198
M3 - Article
AN - SCOPUS:85069202348
VL - 2
SP - 1592
EP - 1598
JO - Advances in Science, Technology and Engineering Systems
JF - Advances in Science, Technology and Engineering Systems
IS - 3
ER -