Details
| Original language | English |
|---|---|
| Article number | 4657401 |
| Pages (from-to) | 2628-2634 |
| Number of pages | 7 |
| Journal | IEEE Transactions on Microwave Theory and Techniques |
| Volume | 56 |
| Issue number | 11 |
| Publication status | Published - Nov 2008 |
Abstract
In this paper, an introduction to contactless vector network analysis is given. Furthermore, the implementation of a contactless measurement setup is presented using different printed coupling structures. The coupling structures are connected to a vector network analyzer (VNA) by means of conventional on-wafer probes, as well as planar-coaxial transitions. For the contactless method, conventional calibration algorithms are used to determine the scattering parameters of a device within a complex planar circuit. The contactless measured results are compared to results received with a conventional VNA and to simulation results obtained with a 3-D field simulator. These comparisons show that, especially for small coupling structures of approximately 1 mm, the results correspond well up to 20 GHz.
Keywords
- Calibration technique, Contactless scattering-parameter measurement, Electromagnetic probe, Microwave circuit testing, Vector network analyzer (VNA)
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Radiation
- Physics and Astronomy(all)
- Condensed Matter Physics
- Engineering(all)
- Electrical and Electronic Engineering
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In: IEEE Transactions on Microwave Theory and Techniques, Vol. 56, No. 11, 4657401, 11.2008, p. 2628-2634.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - Contactless vector network analysis with printed loop couplers
AU - Zelder, Thomas
AU - Geck, Bernd
AU - Wollitzer, Michael
AU - Rolfes, Ilona
AU - Eul, Hermann
PY - 2008/11
Y1 - 2008/11
N2 - In this paper, an introduction to contactless vector network analysis is given. Furthermore, the implementation of a contactless measurement setup is presented using different printed coupling structures. The coupling structures are connected to a vector network analyzer (VNA) by means of conventional on-wafer probes, as well as planar-coaxial transitions. For the contactless method, conventional calibration algorithms are used to determine the scattering parameters of a device within a complex planar circuit. The contactless measured results are compared to results received with a conventional VNA and to simulation results obtained with a 3-D field simulator. These comparisons show that, especially for small coupling structures of approximately 1 mm, the results correspond well up to 20 GHz.
AB - In this paper, an introduction to contactless vector network analysis is given. Furthermore, the implementation of a contactless measurement setup is presented using different printed coupling structures. The coupling structures are connected to a vector network analyzer (VNA) by means of conventional on-wafer probes, as well as planar-coaxial transitions. For the contactless method, conventional calibration algorithms are used to determine the scattering parameters of a device within a complex planar circuit. The contactless measured results are compared to results received with a conventional VNA and to simulation results obtained with a 3-D field simulator. These comparisons show that, especially for small coupling structures of approximately 1 mm, the results correspond well up to 20 GHz.
KW - Calibration technique
KW - Contactless scattering-parameter measurement
KW - Electromagnetic probe
KW - Microwave circuit testing
KW - Vector network analyzer (VNA)
UR - http://www.scopus.com/inward/record.url?scp=55849150914&partnerID=8YFLogxK
U2 - 10.1109/TMTT.2008.2005893
DO - 10.1109/TMTT.2008.2005893
M3 - Article
AN - SCOPUS:55849150914
VL - 56
SP - 2628
EP - 2634
JO - IEEE Transactions on Microwave Theory and Techniques
JF - IEEE Transactions on Microwave Theory and Techniques
SN - 0018-9480
IS - 11
M1 - 4657401
ER -