Details
| Original language | English |
|---|---|
| Title of host publication | Designcon 2009 |
| Pages | 1266-1289 |
| Number of pages | 24 |
| Publication status | Published - 2009 |
| Event | Designcon 2009 - Santa Clara, CA, United States Duration: 2 Feb 2009 → 5 Feb 2009 |
Publication series
| Name | Designcon 2009 |
|---|---|
| Volume | 3 |
Abstract
After a short introduction to conventional vector network analysis the principle and the implementation of a contactless measurement setup for the determination of the scattering parameters of embedded devices is presented. Suitable contactless and pseudo-contactless probes are developed for the implementation of the setup and calibration procedures which take the characteristic of the probes into account are described. For verification purposes the contactlessly measured results are compared with results received with a conventional vector network analyzer as well as with simulation results obtained with a 3D field simulator.
ASJC Scopus subject areas
- Computer Science(all)
- Computer Networks and Communications
- Engineering(all)
- Electrical and Electronic Engineering
Cite this
- Standard
- Harvard
- Apa
- Vancouver
- BibTeX
- RIS
Designcon 2009. 2009. p. 1266-1289 (Designcon 2009; Vol. 3).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Contactless vector network analysis
T2 - Designcon 2009
AU - Zelder, Thomas
AU - Rosenberger, Bernhard
AU - Geck, Bernd
AU - Rolfes, Ilona
PY - 2009
Y1 - 2009
N2 - After a short introduction to conventional vector network analysis the principle and the implementation of a contactless measurement setup for the determination of the scattering parameters of embedded devices is presented. Suitable contactless and pseudo-contactless probes are developed for the implementation of the setup and calibration procedures which take the characteristic of the probes into account are described. For verification purposes the contactlessly measured results are compared with results received with a conventional vector network analyzer as well as with simulation results obtained with a 3D field simulator.
AB - After a short introduction to conventional vector network analysis the principle and the implementation of a contactless measurement setup for the determination of the scattering parameters of embedded devices is presented. Suitable contactless and pseudo-contactless probes are developed for the implementation of the setup and calibration procedures which take the characteristic of the probes into account are described. For verification purposes the contactlessly measured results are compared with results received with a conventional vector network analyzer as well as with simulation results obtained with a 3D field simulator.
UR - http://www.scopus.com/inward/record.url?scp=84866387033&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:84866387033
SN - 9781615670499
T3 - Designcon 2009
SP - 1266
EP - 1289
BT - Designcon 2009
Y2 - 2 February 2009 through 5 February 2009
ER -