Details
| Original language | English |
|---|---|
| Title of host publication | Proceedings of the 37th European Microwave Conference, EUMC |
| Pages | 246-249 |
| Number of pages | 4 |
| Publication status | Published - 2007 |
| Event | 37th European Microwave Conference, EUMC - Munich, Germany Duration: 9 Oct 2007 → 12 Oct 2007 |
Publication series
| Name | Proceedings of the 37th European Microwave Conference, EUMC |
|---|
Abstract
In this paper a system for the contactless measurement of the scattering parameters of planar two-port devices is presented. Thereby, loop couplers are used as probes. The system is calibrated with the Thru-Reflect-Line calibration algorithm regarding planar reference planes. This provides the possibility to measure scattering parameters of devices embedded in complex planar circuits. The contactless measured scattering parameters of different devices are compared with results received by a conventional vector network analyzer. This comparison shows that the results are corresponding to each other. Furthermore, it is shown, that a contactless measurement of an embedded DUT is possible.
Keywords
- Calibration technique, Contactless scattering-parameter measurement, Electromagnetic probe, Microwave circuit testing, Vector network analyzer
ASJC Scopus subject areas
- Engineering(all)
- Electrical and Electronic Engineering
Cite this
- Standard
- Harvard
- Apa
- Vancouver
- BibTeX
- RIS
Proceedings of the 37th European Microwave Conference, EUMC. 2007. p. 246-249 4405172 (Proceedings of the 37th European Microwave Conference, EUMC).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Contactless network analysis system for the calibrated measurement of the scattering parameters of planar two-port devices
AU - Zelder, Thomas
AU - Geck, Bernd
AU - Wollitzer, Michael
AU - Rolfes, Ilona
AU - Eul, Hermann
PY - 2007
Y1 - 2007
N2 - In this paper a system for the contactless measurement of the scattering parameters of planar two-port devices is presented. Thereby, loop couplers are used as probes. The system is calibrated with the Thru-Reflect-Line calibration algorithm regarding planar reference planes. This provides the possibility to measure scattering parameters of devices embedded in complex planar circuits. The contactless measured scattering parameters of different devices are compared with results received by a conventional vector network analyzer. This comparison shows that the results are corresponding to each other. Furthermore, it is shown, that a contactless measurement of an embedded DUT is possible.
AB - In this paper a system for the contactless measurement of the scattering parameters of planar two-port devices is presented. Thereby, loop couplers are used as probes. The system is calibrated with the Thru-Reflect-Line calibration algorithm regarding planar reference planes. This provides the possibility to measure scattering parameters of devices embedded in complex planar circuits. The contactless measured scattering parameters of different devices are compared with results received by a conventional vector network analyzer. This comparison shows that the results are corresponding to each other. Furthermore, it is shown, that a contactless measurement of an embedded DUT is possible.
KW - Calibration technique
KW - Contactless scattering-parameter measurement
KW - Electromagnetic probe
KW - Microwave circuit testing
KW - Vector network analyzer
UR - http://www.scopus.com/inward/record.url?scp=48349085471&partnerID=8YFLogxK
U2 - 10.1109/EUMC.2007.4405172
DO - 10.1109/EUMC.2007.4405172
M3 - Conference contribution
AN - SCOPUS:48349085471
SN - 9782874870033
T3 - Proceedings of the 37th European Microwave Conference, EUMC
SP - 246
EP - 249
BT - Proceedings of the 37th European Microwave Conference, EUMC
T2 - 37th European Microwave Conference, EUMC
Y2 - 9 October 2007 through 12 October 2007
ER -