Contacting a single nanometer-sized pinhole in the interfacial oxide of a poly-silicon on oxide (POLO) solar cell junction

Research output: Contribution to journalArticleResearchpeer review

Authors

  • Paul Bayerl
  • Nils Folchert
  • Johannes Bayer
  • Marvin Dzinnik
  • Christina Hollemann
  • Rolf Brendel
  • Robby Peibst
  • Rolf J. Haug
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Details

Original languageEnglish
Pages (from-to)936-942
Number of pages7
JournalProgress in Photovoltaics: Research and Applications
Volume29
Issue number8
Early online date30 Mar 2021
Publication statusPublished - 16 Jul 2021

Abstract

The electrical current through poly-Si on oxide (POLO) solar cells is mediated by tunneling and by nanometer-sized pinholes in the interfacial oxide. To distinguish the two processes, a POLO junction with a measured pinhole density of 1 × 107 cm−2 is contacted by different contact areas ranging from 1 μm2 to 2.5 × 105 μm2, and the temperature-dependent current–voltage curves are measured for the different devices. Model regressions to the measured curves, their temperature dependence, and the quantized value of contact resistances indicate average numbers of pinholes per device corresponding to the expected pinhole density. For the small contacts, the different transport processes can be studied separately, which facilitates further improvements in respect to the present-day POLO junctions. Single-pinhole transport is found for one of the contacts with an area of 1 μm2. Random telegraph noise observed for this device in the current–voltage characteristics shows a high sensitivity to single charges.

Keywords

    pinhole transport, POLO junction, record energy conversion efficiency, silicon solar cell

ASJC Scopus subject areas

Sustainable Development Goals

Cite this

Contacting a single nanometer-sized pinhole in the interfacial oxide of a poly-silicon on oxide (POLO) solar cell junction. / Bayerl, Paul; Folchert, Nils; Bayer, Johannes et al.
In: Progress in Photovoltaics: Research and Applications, Vol. 29, No. 8, 16.07.2021, p. 936-942.

Research output: Contribution to journalArticleResearchpeer review

Bayerl P, Folchert N, Bayer J, Dzinnik M, Hollemann C, Brendel R et al. Contacting a single nanometer-sized pinhole in the interfacial oxide of a poly-silicon on oxide (POLO) solar cell junction. Progress in Photovoltaics: Research and Applications. 2021 Jul 16;29(8):936-942. Epub 2021 Mar 30. doi: 10.1002/pip.3417
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title = "Contacting a single nanometer-sized pinhole in the interfacial oxide of a poly-silicon on oxide (POLO) solar cell junction",
abstract = "The electrical current through poly-Si on oxide (POLO) solar cells is mediated by tunneling and by nanometer-sized pinholes in the interfacial oxide. To distinguish the two processes, a POLO junction with a measured pinhole density of 1 × 107 cm−2 is contacted by different contact areas ranging from 1 μm2 to 2.5 × 105 μm2, and the temperature-dependent current–voltage curves are measured for the different devices. Model regressions to the measured curves, their temperature dependence, and the quantized value of contact resistances indicate average numbers of pinholes per device corresponding to the expected pinhole density. For the small contacts, the different transport processes can be studied separately, which facilitates further improvements in respect to the present-day POLO junctions. Single-pinhole transport is found for one of the contacts with an area of 1 μm2. Random telegraph noise observed for this device in the current–voltage characteristics shows a high sensitivity to single charges.",
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author = "Paul Bayerl and Nils Folchert and Johannes Bayer and Marvin Dzinnik and Christina Hollemann and Rolf Brendel and Robby Peibst and Haug, {Rolf J.}",
note = "Funding Information: This work was funded by the Federal Ministry of Economic Affairs and Energy (BMWi), Germany (under project 26+ with the number FKZ0325827A), the State of Lower Saxony, Germany (via the Hannover School for Nanotechnology and the School for Contacts in Nanosystems), and the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) under Germany's Excellence Strategy–EXC 2123 Quantum Frontiers, 390837967. The authors thank Bianca Gehring for performing the TMAH etching and SEM analysis, S{\"o}ren Sch{\"a}fer, Felix Haase, and Jan Kr{\"u}gener for valuable discussions, and Raymond Zienriss, Annika Raugewitz, Hilke Fischer, and Sabine Schmidt for their help with sample processing. We thank Oliver Kerker for helping with the processing. ",
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AU - Bayerl, Paul

AU - Folchert, Nils

AU - Bayer, Johannes

AU - Dzinnik, Marvin

AU - Hollemann, Christina

AU - Brendel, Rolf

AU - Peibst, Robby

AU - Haug, Rolf J.

N1 - Funding Information: This work was funded by the Federal Ministry of Economic Affairs and Energy (BMWi), Germany (under project 26+ with the number FKZ0325827A), the State of Lower Saxony, Germany (via the Hannover School for Nanotechnology and the School for Contacts in Nanosystems), and the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) under Germany's Excellence Strategy–EXC 2123 Quantum Frontiers, 390837967. The authors thank Bianca Gehring for performing the TMAH etching and SEM analysis, Sören Schäfer, Felix Haase, and Jan Krügener for valuable discussions, and Raymond Zienriss, Annika Raugewitz, Hilke Fischer, and Sabine Schmidt for their help with sample processing. We thank Oliver Kerker for helping with the processing.

PY - 2021/7/16

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N2 - The electrical current through poly-Si on oxide (POLO) solar cells is mediated by tunneling and by nanometer-sized pinholes in the interfacial oxide. To distinguish the two processes, a POLO junction with a measured pinhole density of 1 × 107 cm−2 is contacted by different contact areas ranging from 1 μm2 to 2.5 × 105 μm2, and the temperature-dependent current–voltage curves are measured for the different devices. Model regressions to the measured curves, their temperature dependence, and the quantized value of contact resistances indicate average numbers of pinholes per device corresponding to the expected pinhole density. For the small contacts, the different transport processes can be studied separately, which facilitates further improvements in respect to the present-day POLO junctions. Single-pinhole transport is found for one of the contacts with an area of 1 μm2. Random telegraph noise observed for this device in the current–voltage characteristics shows a high sensitivity to single charges.

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