Details
Original language | English |
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Title of host publication | Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 4633-4642 |
Number of pages | 10 |
ISBN (electronic) | 978-1-7281-7168-5 |
ISBN (print) | 978-1-7281-7169-2 |
Publication status | Published - 2020 |
Publication series
Name | Proceedings (IEEE Computer Society Conference on Computer Vision and Pattern Recognition. Online) |
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ISSN (Print) | 1063-6919 |
ISSN (electronic) | 2575-7075 |
Abstract
Keywords
- cs.CV
ASJC Scopus subject areas
- Computer Science(all)
- Software
- Computer Science(all)
- Computer Vision and Pattern Recognition
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Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition. Institute of Electrical and Electronics Engineers Inc., 2020. p. 4633-4642 (Proceedings (IEEE Computer Society Conference on Computer Vision and Pattern Recognition. Online)).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - CONSAC
T2 - Robust Multi-Model Fitting by Conditional Sample Consensus
AU - Kluger, Florian
AU - Brachmann, Eric
AU - Ackermann, Hanno
AU - Rother, Carsten
AU - Yang, Michael Ying
AU - Rosenhahn, Bodo
N1 - Funding Information: Acknowledgements This work was supported by the DFG grant COVMAP (RO 4804/2-1 and RO 2497/12-2) and has received funding from the European Research Council (ERC) under the European Union Horizon 2020 programme (grant No. 647769).
PY - 2020
Y1 - 2020
N2 - We present a robust estimator for fitting multiple parametric models of the same form to noisy measurements. Applications include finding multiple vanishing points in man-made scenes, fitting planes to architectural imagery, or estimating multiple rigid motions within the same sequence. In contrast to previous works, which resorted to hand-crafted search strategies for multiple model detection, we learn the search strategy from data. A neural network conditioned on previously detected models guides a RANSAC estimator to different subsets of all measurements, thereby finding model instances one after another. We train our method supervised as well as self-supervised. For supervised training of the search strategy, we contribute a new dataset for vanishing point estimation. Leveraging this dataset, the proposed algorithm is superior with respect to other robust estimators as well as to designated vanishing point estimation algorithms. For self-supervised learning of the search, we evaluate the proposed algorithm on multi-homography estimation and demonstrate an accuracy that is superior to state-of-the-art methods.
AB - We present a robust estimator for fitting multiple parametric models of the same form to noisy measurements. Applications include finding multiple vanishing points in man-made scenes, fitting planes to architectural imagery, or estimating multiple rigid motions within the same sequence. In contrast to previous works, which resorted to hand-crafted search strategies for multiple model detection, we learn the search strategy from data. A neural network conditioned on previously detected models guides a RANSAC estimator to different subsets of all measurements, thereby finding model instances one after another. We train our method supervised as well as self-supervised. For supervised training of the search strategy, we contribute a new dataset for vanishing point estimation. Leveraging this dataset, the proposed algorithm is superior with respect to other robust estimators as well as to designated vanishing point estimation algorithms. For self-supervised learning of the search, we evaluate the proposed algorithm on multi-homography estimation and demonstrate an accuracy that is superior to state-of-the-art methods.
KW - cs.CV
UR - http://www.scopus.com/inward/record.url?scp=85089157079&partnerID=8YFLogxK
U2 - 10.1109/CVPR42600.2020.00469
DO - 10.1109/CVPR42600.2020.00469
M3 - Conference contribution
SN - 978-1-7281-7169-2
T3 - Proceedings (IEEE Computer Society Conference on Computer Vision and Pattern Recognition. Online)
SP - 4633
EP - 4642
BT - Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
PB - Institute of Electrical and Electronics Engineers Inc.
ER -