Coated optics for DUV-excimer laser applications

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • Jens Ullmann
  • Michael Mertin
  • Hans Lauth
  • Helmut Bernitzki
  • Klaus R. Mann
  • Detlev Ristau
  • Winfried Arens
  • Roland Thielsch
  • Norbert Kaiser

External Research Organisations

  • Laser Zentrum Hannover e.V. (LZH)
  • JENOPTIK Laser GmbH
  • Laser-Laboratorium Göttingen e.V.
  • Fraunhofer Institute for Applied Optics and Precision Engineering (IOF)
  • Carl Zeiss SMT GmbH
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Details

Original languageEnglish
Title of host publicationLaser-Induced Damage in Optical Materials: 1999
Subtitle of host publication4 - 7 October 1999, Boulder, Colorado ; proceedings
Place of PublicationBellingham
PublisherSPIE
Pages514-527
Number of pages14
ISBN (print)0-8194-3508-2
Publication statusPublished - 3 Mar 2000
Externally publishedYes
Event31st Annual Boulder Damage Symposium: 'Laser-Induced Damage in Optical Materials 1999' - Boulder, CO, USA
Duration: 4 Oct 19997 Oct 1999

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Volume3902
ISSN (Print)0277-786X

Abstract

Recent developments of DUV-excimer laser applications have gained in demands for radiation resistant coated components at interesting wavelengths. To meet the requirements of long term reliability and high pulse number throughput superior performance of the optical components with lowest absorption and scattering losses are necessary. In the framework of the German Joint Research Project OPUS II efforts are made to investigate the optical properties, the radiation resistance and long term stability of single layers and layer systems of interest in the DUV. The evaluation of optical coatings and coating systems (AR and HR) on different substrate materials was carried out by scattering experiments, atomic force microscopy, infrared spectroscopy, calorimetric absorption measurements, and determination of laser induced damage threshold (1-on-1, 1000-on-1). Additionally from the spectralphotometric measurements the optical behaviour of the films was examined.

ASJC Scopus subject areas

Cite this

Coated optics for DUV-excimer laser applications. / Ullmann, Jens; Mertin, Michael; Lauth, Hans et al.
Laser-Induced Damage in Optical Materials: 1999: 4 - 7 October 1999, Boulder, Colorado ; proceedings. Bellingham: SPIE, 2000. p. 514-527 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 3902).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Ullmann, J, Mertin, M, Lauth, H, Bernitzki, H, Mann, KR, Ristau, D, Arens, W, Thielsch, R & Kaiser, N 2000, Coated optics for DUV-excimer laser applications. in Laser-Induced Damage in Optical Materials: 1999: 4 - 7 October 1999, Boulder, Colorado ; proceedings. Proceedings of SPIE - The International Society for Optical Engineering, vol. 3902, SPIE, Bellingham, pp. 514-527, 31st Annual Boulder Damage Symposium: 'Laser-Induced Damage in Optical Materials 1999', Boulder, CO, USA, 4 Oct 1999. https://doi.org/10.1117/12.379348
Ullmann, J., Mertin, M., Lauth, H., Bernitzki, H., Mann, K. R., Ristau, D., Arens, W., Thielsch, R., & Kaiser, N. (2000). Coated optics for DUV-excimer laser applications. In Laser-Induced Damage in Optical Materials: 1999: 4 - 7 October 1999, Boulder, Colorado ; proceedings (pp. 514-527). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 3902). SPIE. https://doi.org/10.1117/12.379348
Ullmann J, Mertin M, Lauth H, Bernitzki H, Mann KR, Ristau D et al. Coated optics for DUV-excimer laser applications. In Laser-Induced Damage in Optical Materials: 1999: 4 - 7 October 1999, Boulder, Colorado ; proceedings. Bellingham: SPIE. 2000. p. 514-527. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.379348
Ullmann, Jens ; Mertin, Michael ; Lauth, Hans et al. / Coated optics for DUV-excimer laser applications. Laser-Induced Damage in Optical Materials: 1999: 4 - 7 October 1999, Boulder, Colorado ; proceedings. Bellingham : SPIE, 2000. pp. 514-527 (Proceedings of SPIE - The International Society for Optical Engineering).
Download
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