Details
| Original language | English |
|---|---|
| Title of host publication | ICSICT 2008 - 2008 9th International Conference on Solid-State and Integrated-Circuit Technology Proceedings |
| Pages | 496-499 |
| Number of pages | 4 |
| Publication status | Published - 2008 |
| Event | 2008 9th International Conference on Solid-State and Integrated-Circuit Technology, ICSICT 2008 - Beijing, China Duration: 20 Oct 2008 → 23 Oct 2008 |
Publication series
| Name | International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT |
|---|
Abstract
Especially in the field of safety critical applications the impact of process variations on the behavior of integrated circuits can not be neglected. Usually, simulation is costly due to the need for multiple simulation runs with different technology parameter settings. In the past, semi-symbolic-simulation applying affine arithmetic (AA) [1], as a suitable range arithmetic, has produced very motivating results on netlistlevel [2]. Using AA reduces the complexity without loosing generality of the simulation results. This paper covers the formulation of effective highlevel circuit models. We use piecewise affine functions to model the circuit and to provide fast simulations while simultaneously achieving good convergence. The equations are separated into matrices for linear mapping and matrices for the representation of the system's state. We formulate the uncertainties within the system with affine terms entered in the system matrices. Furthermore, we present the relevant solution algorithms for the semi symbolic simulation and their implementation.
ASJC Scopus subject areas
- Engineering(all)
- Electrical and Electronic Engineering
- Physics and Astronomy(all)
- Condensed Matter Physics
- Materials Science(all)
- Electronic, Optical and Magnetic Materials
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ICSICT 2008 - 2008 9th International Conference on Solid-State and Integrated-Circuit Technology Proceedings. 2008. p. 496-499 4734572 (International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Circuit simulations with uncertainties using affine arithmetic and piecewise affine statemodels
AU - Freisfeld, M.
AU - Olbrich, M.
AU - Barke, E.
PY - 2008
Y1 - 2008
N2 - Especially in the field of safety critical applications the impact of process variations on the behavior of integrated circuits can not be neglected. Usually, simulation is costly due to the need for multiple simulation runs with different technology parameter settings. In the past, semi-symbolic-simulation applying affine arithmetic (AA) [1], as a suitable range arithmetic, has produced very motivating results on netlistlevel [2]. Using AA reduces the complexity without loosing generality of the simulation results. This paper covers the formulation of effective highlevel circuit models. We use piecewise affine functions to model the circuit and to provide fast simulations while simultaneously achieving good convergence. The equations are separated into matrices for linear mapping and matrices for the representation of the system's state. We formulate the uncertainties within the system with affine terms entered in the system matrices. Furthermore, we present the relevant solution algorithms for the semi symbolic simulation and their implementation.
AB - Especially in the field of safety critical applications the impact of process variations on the behavior of integrated circuits can not be neglected. Usually, simulation is costly due to the need for multiple simulation runs with different technology parameter settings. In the past, semi-symbolic-simulation applying affine arithmetic (AA) [1], as a suitable range arithmetic, has produced very motivating results on netlistlevel [2]. Using AA reduces the complexity without loosing generality of the simulation results. This paper covers the formulation of effective highlevel circuit models. We use piecewise affine functions to model the circuit and to provide fast simulations while simultaneously achieving good convergence. The equations are separated into matrices for linear mapping and matrices for the representation of the system's state. We formulate the uncertainties within the system with affine terms entered in the system matrices. Furthermore, we present the relevant solution algorithms for the semi symbolic simulation and their implementation.
UR - http://www.scopus.com/inward/record.url?scp=60649104906&partnerID=8YFLogxK
U2 - 10.1109/ICSICT.2008.4734572
DO - 10.1109/ICSICT.2008.4734572
M3 - Conference contribution
AN - SCOPUS:60649104906
SN - 9781424421855
T3 - International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT
SP - 496
EP - 499
BT - ICSICT 2008 - 2008 9th International Conference on Solid-State and Integrated-Circuit Technology Proceedings
T2 - 2008 9th International Conference on Solid-State and Integrated-Circuit Technology, ICSICT 2008
Y2 - 20 October 2008 through 23 October 2008
ER -