Circuit breaker life assessment based on the defect statistics and cost analysis

Research output: Contribution to conference › Paper › Research › peer review

Authors

  • Kai Gao
  • Zhaolin Liu
  • Linghui Yang
  • X. Zhang
  • Ernst Gockenbach

Research Organisations

External Research Organisations

  • East China Grid (ECGC)
  • East China Electrical Test and Research Institute
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Details

Original languageEnglish
Publication statusPublished - 2011

Cite this

Circuit breaker life assessment based on the defect statistics and cost analysis. / Gao, Kai; Liu, Zhaolin; Yang, Linghui et al.
2011.

Research output: Contribution to conference › Paper › Research › peer review

Gao, K, Liu, Z, Yang, L, Zhang, X & Gockenbach, E 2011, 'Circuit breaker life assessment based on the defect statistics and cost analysis'.
Gao, K., Liu, Z., Yang, L., Zhang, X., & Gockenbach, E. (2011). Circuit breaker life assessment based on the defect statistics and cost analysis.
Gao K, Liu Z, Yang L, Zhang X, Gockenbach E. Circuit breaker life assessment based on the defect statistics and cost analysis. 2011.
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title = "Circuit breaker life assessment based on the defect statistics and cost analysis",
author = "Kai Gao and Zhaolin Liu and Linghui Yang and X. Zhang and Ernst Gockenbach",
year = "2011",
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TY - CONF

T1 - Circuit breaker life assessment based on the defect statistics and cost analysis

AU - Gao, Kai

AU - Liu, Zhaolin

AU - Yang, Linghui

AU - Zhang, X.

AU - Gockenbach, Ernst

PY - 2011

Y1 - 2011

UR - http://vlabs.iitkgp.ac.in/vhvlab/html/pages/CD/topics_a-h/G-032-GAO-F.pdf

M3 - Paper

ER -