Chopped sample heating for quantitative profile analysis of low energy electron diffraction spots at high temperatures

Research output: Contribution to journalArticleResearchpeer review

Authors

  • P. Kury
  • P. Zahl
  • M. Horn-von Hoegen
  • C. Voges
  • H. Frischat
  • H. L. Günter
  • Herbert Pfnür
  • Martin Henzler

Research Organisations

External Research Organisations

  • University of Duisburg-Essen
  • IBM Zurich Research Laboratory
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Details

Original languageEnglish
Pages (from-to)4911-4915
Number of pages5
JournalReview of Scientific Instruments
Volume75
Issue number11
Publication statusPublished - 2 Nov 2004

Abstract

Spot profile analysis low energy electron diffraction (SPA-LEED) is one of the most versatile and powerful methods for the determination of the structure and morphology of surfaces even at elevated temperatures. In setups where the sample is heated directly by an electric current, the resolution of the diffraction images at higher temperatures can be heavily degraded due to the inhomogeneous electric and magnetic fields around the sample. Here we present an easily applicable modification of the common data acquisition hardware of the SPA-LEED, which enables the system to work in a pulsed heating mode: Instead of heating the sample with a constant current, a square wave is used and electron counting is only performed when the current through the sample vanishes. Thus, undistorted diffration images can be acquired at high temperatures.

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Cite this

Chopped sample heating for quantitative profile analysis of low energy electron diffraction spots at high temperatures. / Kury, P.; Zahl, P.; Horn-von Hoegen, M. et al.
In: Review of Scientific Instruments, Vol. 75, No. 11, 02.11.2004, p. 4911-4915.

Research output: Contribution to journalArticleResearchpeer review

Kury, P, Zahl, P, Horn-von Hoegen, M, Voges, C, Frischat, H, Günter, HL, Pfnür, H & Henzler, M 2004, 'Chopped sample heating for quantitative profile analysis of low energy electron diffraction spots at high temperatures', Review of Scientific Instruments, vol. 75, no. 11, pp. 4911-4915. https://doi.org/10.1063/1.1807003
Kury P, Zahl P, Horn-von Hoegen M, Voges C, Frischat H, Günter HL et al. Chopped sample heating for quantitative profile analysis of low energy electron diffraction spots at high temperatures. Review of Scientific Instruments. 2004 Nov 2;75(11):4911-4915. doi: 10.1063/1.1807003
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