Details
| Original language | English |
|---|---|
| Title of host publication | 2023 42nd IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2023 - Proceedings |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (electronic) | 979-8-3503-2225-5 |
| ISBN (print) | 979-8-3503-2226-2 |
| Publication status | Published - 2023 |
| Event | 42nd IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2023 - San Francisco, United States Duration: 28 Oct 2023 → 2 Nov 2023 |
Publication series
| Name | IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD |
|---|---|
| ISSN (Print) | 1092-3152 |
Abstract
Shrinking hardware structures and decreasing operating voltages lead to an increasing number of transient hardware faults, which thus become a core problem to consider for safety-critical systems. Here, systematic fault injection (FI), where one program-under-test is systematically stressed with faults, provides an in-depth resilience analysis in the presence of faults. However, FI campaigns require many independent injection experiments and, combined, long run times, especially if we aim for a high coverage of the fault space. One cost factor is the forwarding phase, which is the time required to bring the system-under test into the fault-free state at injection time. One common technique to speed up the forwarding are checkpoints of the fault-free system state at fixed points in time. In this paper, we show that the placement of checkpoints has a significant influence on the required forwarding cycles, especially if we place faults non-uniformly on the time axis. For this, we discuss the checkpoint-selection problem in general, formalize it as a maximum-weight reward path problem in graphs, propose an ILP formulation and a dynamic programming algorithm that find the optimal solution, and provide a heuristic checkpoint-selection method based on a genetic algorithm. Applied to the MiBench benchmark suite, our approach consistently reduces the forward-phase cycles by at least 88 percent and up to 99.934 percent when placing 16 checkpoints.
Keywords
- Checkpoint Placement, Fault Injection
ASJC Scopus subject areas
- Computer Science(all)
- Software
- Computer Science(all)
- Computer Science Applications
- Computer Science(all)
- Computer Graphics and Computer-Aided Design
Cite this
- Standard
- Harvard
- Apa
- Vancouver
- BibTeX
- RIS
2023 42nd IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2023 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2023. (IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Checkpoint Placement for Systematic Fault-Injection Campaigns
AU - Dietrich, Christian
AU - Thomas, Tim Marek
AU - Mnich, Matthias
N1 - Publisher Copyright: © 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - Shrinking hardware structures and decreasing operating voltages lead to an increasing number of transient hardware faults, which thus become a core problem to consider for safety-critical systems. Here, systematic fault injection (FI), where one program-under-test is systematically stressed with faults, provides an in-depth resilience analysis in the presence of faults. However, FI campaigns require many independent injection experiments and, combined, long run times, especially if we aim for a high coverage of the fault space. One cost factor is the forwarding phase, which is the time required to bring the system-under test into the fault-free state at injection time. One common technique to speed up the forwarding are checkpoints of the fault-free system state at fixed points in time. In this paper, we show that the placement of checkpoints has a significant influence on the required forwarding cycles, especially if we place faults non-uniformly on the time axis. For this, we discuss the checkpoint-selection problem in general, formalize it as a maximum-weight reward path problem in graphs, propose an ILP formulation and a dynamic programming algorithm that find the optimal solution, and provide a heuristic checkpoint-selection method based on a genetic algorithm. Applied to the MiBench benchmark suite, our approach consistently reduces the forward-phase cycles by at least 88 percent and up to 99.934 percent when placing 16 checkpoints.
AB - Shrinking hardware structures and decreasing operating voltages lead to an increasing number of transient hardware faults, which thus become a core problem to consider for safety-critical systems. Here, systematic fault injection (FI), where one program-under-test is systematically stressed with faults, provides an in-depth resilience analysis in the presence of faults. However, FI campaigns require many independent injection experiments and, combined, long run times, especially if we aim for a high coverage of the fault space. One cost factor is the forwarding phase, which is the time required to bring the system-under test into the fault-free state at injection time. One common technique to speed up the forwarding are checkpoints of the fault-free system state at fixed points in time. In this paper, we show that the placement of checkpoints has a significant influence on the required forwarding cycles, especially if we place faults non-uniformly on the time axis. For this, we discuss the checkpoint-selection problem in general, formalize it as a maximum-weight reward path problem in graphs, propose an ILP formulation and a dynamic programming algorithm that find the optimal solution, and provide a heuristic checkpoint-selection method based on a genetic algorithm. Applied to the MiBench benchmark suite, our approach consistently reduces the forward-phase cycles by at least 88 percent and up to 99.934 percent when placing 16 checkpoints.
KW - Checkpoint Placement
KW - Fault Injection
UR - http://www.scopus.com/inward/record.url?scp=85181397790&partnerID=8YFLogxK
U2 - 10.48550/arXiv.2308.05521
DO - 10.48550/arXiv.2308.05521
M3 - Conference contribution
AN - SCOPUS:85181397790
SN - 979-8-3503-2226-2
T3 - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
BT - 2023 42nd IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2023 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 42nd IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2023
Y2 - 28 October 2023 through 2 November 2023
ER -