Details
Original language | English |
---|---|
Pages (from-to) | 76-80 |
Number of pages | 5 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 688 |
Publication status | Published - 9 Apr 1987 |
Externally published | Yes |
Event | 30th Annual Technical Symposium - San Diego , United States Duration: 1 Aug 1986 → 3 Aug 1986 |
Abstract
A reflectometer has been set up at the radiometric laboratory of PTB at the Berlin electron storage ring BESSY. Special attention has been paid to optimize the instrumentation for the characterization of multilayer structures suitable for laboratory soft x-ray laser research. The instrumentation is described and its performance demonstrated showing examples of optical component characterization.
ASJC Scopus subject areas
- Materials Science(all)
- Electronic, Optical and Magnetic Materials
- Physics and Astronomy(all)
- Condensed Matter Physics
- Computer Science(all)
- Computer Science Applications
- Mathematics(all)
- Applied Mathematics
- Engineering(all)
- Electrical and Electronic Engineering
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In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 688, 09.04.1987, p. 76-80.
Research output: Contribution to journal › Conference article › Research › peer review
}
TY - JOUR
T1 - Characterization of multilayer structures for soft x-ray laser research
AU - Kühne, M.
AU - Danzmann, K.
AU - Muller, P.
AU - Wende, B.
AU - Ceglio, N. M.
AU - Stearns, D. G.
AU - Hawryluk, A. M.
PY - 1987/4/9
Y1 - 1987/4/9
N2 - A reflectometer has been set up at the radiometric laboratory of PTB at the Berlin electron storage ring BESSY. Special attention has been paid to optimize the instrumentation for the characterization of multilayer structures suitable for laboratory soft x-ray laser research. The instrumentation is described and its performance demonstrated showing examples of optical component characterization.
AB - A reflectometer has been set up at the radiometric laboratory of PTB at the Berlin electron storage ring BESSY. Special attention has been paid to optimize the instrumentation for the characterization of multilayer structures suitable for laboratory soft x-ray laser research. The instrumentation is described and its performance demonstrated showing examples of optical component characterization.
UR - http://www.scopus.com/inward/record.url?scp=0023586338&partnerID=8YFLogxK
U2 - 10.1117/12.964825
DO - 10.1117/12.964825
M3 - Conference article
AN - SCOPUS:0023586338
VL - 688
SP - 76
EP - 80
JO - Proceedings of SPIE - The International Society for Optical Engineering
JF - Proceedings of SPIE - The International Society for Optical Engineering
SN - 0277-786X
T2 - 30th Annual Technical Symposium
Y2 - 1 August 1986 through 3 August 1986
ER -