Characterization of multilayer structures for soft x-ray laser research

Research output: Contribution to journalConference articleResearchpeer review

Authors

  • M. Kühne
  • K. Danzmann
  • P. Muller
  • B. Wende
  • N. M. Ceglio
  • D. G. Stearns
  • A. M. Hawryluk

External Research Organisations

  • Physikalisch-Technische Bundesanstalt PTB
  • Lawrence Livermore National Laboratory
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Details

Original languageEnglish
Pages (from-to)76-80
Number of pages5
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume688
Publication statusPublished - 9 Apr 1987
Externally publishedYes
Event30th Annual Technical Symposium - San Diego , United States
Duration: 1 Aug 19863 Aug 1986

Abstract

A reflectometer has been set up at the radiometric laboratory of PTB at the Berlin electron storage ring BESSY. Special attention has been paid to optimize the instrumentation for the characterization of multilayer structures suitable for laboratory soft x-ray laser research. The instrumentation is described and its performance demonstrated showing examples of optical component characterization.

ASJC Scopus subject areas

Cite this

Characterization of multilayer structures for soft x-ray laser research. / Kühne, M.; Danzmann, K.; Muller, P. et al.
In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 688, 09.04.1987, p. 76-80.

Research output: Contribution to journalConference articleResearchpeer review

Kühne, M, Danzmann, K, Muller, P, Wende, B, Ceglio, NM, Stearns, DG & Hawryluk, AM 1987, 'Characterization of multilayer structures for soft x-ray laser research', Proceedings of SPIE - The International Society for Optical Engineering, vol. 688, pp. 76-80. https://doi.org/10.1117/12.964825
Kühne, M., Danzmann, K., Muller, P., Wende, B., Ceglio, N. M., Stearns, D. G., & Hawryluk, A. M. (1987). Characterization of multilayer structures for soft x-ray laser research. Proceedings of SPIE - The International Society for Optical Engineering, 688, 76-80. https://doi.org/10.1117/12.964825
Kühne M, Danzmann K, Muller P, Wende B, Ceglio NM, Stearns DG et al. Characterization of multilayer structures for soft x-ray laser research. Proceedings of SPIE - The International Society for Optical Engineering. 1987 Apr 9;688:76-80. doi: 10.1117/12.964825
Kühne, M. ; Danzmann, K. ; Muller, P. et al. / Characterization of multilayer structures for soft x-ray laser research. In: Proceedings of SPIE - The International Society for Optical Engineering. 1987 ; Vol. 688. pp. 76-80.
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