Characterization of loaded TEM-waveguides using time-domain reflectometry

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • J. P. Kärst
  • H. Garbe
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Details

Original languageEnglish
Title of host publicationIEEE International Symposium on Electromagnetic Compatibility
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages127-132
Number of pages6
ISBN (electronic)078035057X, 9780780350571
Publication statusPublished - 1999
Event1999 IEEE International Symposium on Electromagnetic Compatibility, EMC 1999 - Seattle, United States
Duration: 2 Aug 19996 Aug 1999

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
Volume1
ISSN (Print)1077-4076
ISSN (electronic)2158-1118

Abstract

An approach is presented to characterize the load state of a TEM-waveguide using the local characteristic impedance Zc(z) derived from time-domain reflectometry (TDR) measurements. The field homogeneity and the field polarization can be estimated using the deviation from the intended Zc=50 Ω of the empty TEM-waveguide. Considering wave propagation only in the TEM-mode an analytical relationship between load state and characteristic impedance is derived. Multiple reflections due to the nonuniformity of the loaded TEM-waveguide and higher order modes excited by the load are taken into account. Experimental results are presented using a GTEM-cell with several load states.

ASJC Scopus subject areas

Cite this

Characterization of loaded TEM-waveguides using time-domain reflectometry. / Kärst, J. P.; Garbe, H.
IEEE International Symposium on Electromagnetic Compatibility. Institute of Electrical and Electronics Engineers Inc., 1999. p. 127-132 812881 (IEEE International Symposium on Electromagnetic Compatibility; Vol. 1).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Kärst, JP & Garbe, H 1999, Characterization of loaded TEM-waveguides using time-domain reflectometry. in IEEE International Symposium on Electromagnetic Compatibility., 812881, IEEE International Symposium on Electromagnetic Compatibility, vol. 1, Institute of Electrical and Electronics Engineers Inc., pp. 127-132, 1999 IEEE International Symposium on Electromagnetic Compatibility, EMC 1999, Seattle, United States, 2 Aug 1999. https://doi.org/10.1109/ISEMC.1999.812881
Kärst, J. P., & Garbe, H. (1999). Characterization of loaded TEM-waveguides using time-domain reflectometry. In IEEE International Symposium on Electromagnetic Compatibility (pp. 127-132). Article 812881 (IEEE International Symposium on Electromagnetic Compatibility; Vol. 1). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISEMC.1999.812881
Kärst JP, Garbe H. Characterization of loaded TEM-waveguides using time-domain reflectometry. In IEEE International Symposium on Electromagnetic Compatibility. Institute of Electrical and Electronics Engineers Inc. 1999. p. 127-132. 812881. (IEEE International Symposium on Electromagnetic Compatibility). doi: 10.1109/ISEMC.1999.812881
Kärst, J. P. ; Garbe, H. / Characterization of loaded TEM-waveguides using time-domain reflectometry. IEEE International Symposium on Electromagnetic Compatibility. Institute of Electrical and Electronics Engineers Inc., 1999. pp. 127-132 (IEEE International Symposium on Electromagnetic Compatibility).
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