Characterization of electromagnetic properties of mid materials for high frequency applications up to 67 GHz

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • Quang Huy Dao
  • Aline Friedrich
  • Bernd Geck
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Details

Original languageEnglish
Title of host publication11th International Congress Molded Interconnect Devices
Subtitle of host publicationScientific Proceedings
EditorsJörg Franke, Thomas Kuhn, Andreas Pojtinger, Albert Birkicht
Pages63-68
Number of pages6
ISBN (electronic)9783038352525
Publication statusE-pub ahead of print - Sept 2014
Event11th International Congress Molded Interconnect Devices, MID 2014 - Nürnberg / Fürth, Germany
Duration: 24 Sept 201425 Sept 2014

Publication series

NameAdvanced Materials Research
Volume1038
ISSN (Print)1022-6680
ISSN (electronic)1662-8985

Abstract

This paper presents results of the research project: "Characterization of the radio frequency (RF) properties of LDS-MID" where RF parameters of laser direct structureable (LDS) molded interconnect device (MID) materials were investigated. First of all the most important material parameters influencing the RF performance of a device are introduced. In the next section the broadband characterization of the metallization and material properties using a coplanar waveguide (CPW) is described. For a selected LDS material the conduction losses due to different metallization compositions are discussed in detail.

Keywords

    Conduction losses, Electromagnetic properties, MID materials

ASJC Scopus subject areas

Cite this

Characterization of electromagnetic properties of mid materials for high frequency applications up to 67 GHz. / Huy Dao, Quang; Friedrich, Aline; Geck, Bernd.
11th International Congress Molded Interconnect Devices : Scientific Proceedings. ed. / Jörg Franke; Thomas Kuhn; Andreas Pojtinger; Albert Birkicht. 2014. p. 63-68 (Advanced Materials Research; Vol. 1038).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Huy Dao, Q, Friedrich, A & Geck, B 2014, Characterization of electromagnetic properties of mid materials for high frequency applications up to 67 GHz. in J Franke, T Kuhn, A Pojtinger & A Birkicht (eds), 11th International Congress Molded Interconnect Devices : Scientific Proceedings. Advanced Materials Research, vol. 1038, pp. 63-68, 11th International Congress Molded Interconnect Devices, MID 2014, Nürnberg / Fürth, Germany, 24 Sept 2014. https://doi.org/10.4028/www.scientific.net/AMR.1038.63
Huy Dao, Q., Friedrich, A., & Geck, B. (2014). Characterization of electromagnetic properties of mid materials for high frequency applications up to 67 GHz. In J. Franke, T. Kuhn, A. Pojtinger, & A. Birkicht (Eds.), 11th International Congress Molded Interconnect Devices : Scientific Proceedings (pp. 63-68). (Advanced Materials Research; Vol. 1038). Advance online publication. https://doi.org/10.4028/www.scientific.net/AMR.1038.63
Huy Dao Q, Friedrich A, Geck B. Characterization of electromagnetic properties of mid materials for high frequency applications up to 67 GHz. In Franke J, Kuhn T, Pojtinger A, Birkicht A, editors, 11th International Congress Molded Interconnect Devices : Scientific Proceedings. 2014. p. 63-68. (Advanced Materials Research). Epub 2014 Sept. doi: 10.4028/www.scientific.net/AMR.1038.63
Huy Dao, Quang ; Friedrich, Aline ; Geck, Bernd. / Characterization of electromagnetic properties of mid materials for high frequency applications up to 67 GHz. 11th International Congress Molded Interconnect Devices : Scientific Proceedings. editor / Jörg Franke ; Thomas Kuhn ; Andreas Pojtinger ; Albert Birkicht. 2014. pp. 63-68 (Advanced Materials Research).
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@inproceedings{d2f8563cfc6543e69f531682952f38e6,
title = "Characterization of electromagnetic properties of mid materials for high frequency applications up to 67 GHz",
abstract = "This paper presents results of the research project: {"}Characterization of the radio frequency (RF) properties of LDS-MID{"} where RF parameters of laser direct structureable (LDS) molded interconnect device (MID) materials were investigated. First of all the most important material parameters influencing the RF performance of a device are introduced. In the next section the broadband characterization of the metallization and material properties using a coplanar waveguide (CPW) is described. For a selected LDS material the conduction losses due to different metallization compositions are discussed in detail.",
keywords = "Conduction losses, Electromagnetic properties, MID materials",
author = "{Huy Dao}, Quang and Aline Friedrich and Bernd Geck",
year = "2014",
month = sep,
doi = "10.4028/www.scientific.net/AMR.1038.63",
language = "English",
series = "Advanced Materials Research",
pages = "63--68",
editor = "J{\"o}rg Franke and Thomas Kuhn and Andreas Pojtinger and Albert Birkicht",
booktitle = "11th International Congress Molded Interconnect Devices",
note = "11th International Congress Molded Interconnect Devices, MID 2014 ; Conference date: 24-09-2014 Through 25-09-2014",

}

Download

TY - GEN

T1 - Characterization of electromagnetic properties of mid materials for high frequency applications up to 67 GHz

AU - Huy Dao, Quang

AU - Friedrich, Aline

AU - Geck, Bernd

PY - 2014/9

Y1 - 2014/9

N2 - This paper presents results of the research project: "Characterization of the radio frequency (RF) properties of LDS-MID" where RF parameters of laser direct structureable (LDS) molded interconnect device (MID) materials were investigated. First of all the most important material parameters influencing the RF performance of a device are introduced. In the next section the broadband characterization of the metallization and material properties using a coplanar waveguide (CPW) is described. For a selected LDS material the conduction losses due to different metallization compositions are discussed in detail.

AB - This paper presents results of the research project: "Characterization of the radio frequency (RF) properties of LDS-MID" where RF parameters of laser direct structureable (LDS) molded interconnect device (MID) materials were investigated. First of all the most important material parameters influencing the RF performance of a device are introduced. In the next section the broadband characterization of the metallization and material properties using a coplanar waveguide (CPW) is described. For a selected LDS material the conduction losses due to different metallization compositions are discussed in detail.

KW - Conduction losses

KW - Electromagnetic properties

KW - MID materials

UR - http://www.scopus.com/inward/record.url?scp=84913582130&partnerID=8YFLogxK

U2 - 10.4028/www.scientific.net/AMR.1038.63

DO - 10.4028/www.scientific.net/AMR.1038.63

M3 - Conference contribution

AN - SCOPUS:84913582130

T3 - Advanced Materials Research

SP - 63

EP - 68

BT - 11th International Congress Molded Interconnect Devices

A2 - Franke, Jörg

A2 - Kuhn, Thomas

A2 - Pojtinger, Andreas

A2 - Birkicht, Albert

T2 - 11th International Congress Molded Interconnect Devices, MID 2014

Y2 - 24 September 2014 through 25 September 2014

ER -