Characterization of 8 fs deep-UV pulses using XPW dispersion scan

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

External Research Organisations

  • Max Born Institute for Nonlinear Optics and Short Pulse Spectroscopy im Forschungsbund Berlin e.V. (MBI)
  • Laser Zentrum Hannover e.V. (LZH)
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Details

Original languageEnglish
Title of host publication2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019
Subtitle of host publicationProceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages1
ISBN (electronic)978-1-7281-0469-0, 978-1-7281-0470-6
Publication statusPublished - Jun 2019
Event2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019 - Munich, Germany
Duration: 23 Jun 201927 Jun 2019

Abstract

The measurement of few-fs-long deep-ultraviolet (DUV) pulses is one of the most demanding tasks for optical pulse characterization as these pulses are very much prone to material dispersion and space-time distortions. Therefore, the arrangements should be very carefully designed not to deteriorate the pulses in the course of the measurement. Furthermore, in this wavelength range the most popular nonlinearities used for the characterization such as second harmonic or sum frequency generation processes become unpractical or even unfeasible due to the very limited phase-matching or the even shorter wavelength of the resulted signal. Consequently, up to now most of short UV pulses were characterized by the FROG technique utilizing a degenerate four-wave mixing process, such as self diffraction [1] or transient grating formation [2]. Nevertheless, this technique suffers from rather bad signal to noise ratio and low sensitivity due to wave front splitting necessary for such method.

ASJC Scopus subject areas

Cite this

Characterization of 8 fs deep-UV pulses using XPW dispersion scan. / Tajalli, Ayhan; Kalousdian, Thomas K.; Kretschmar, Martin et al.
2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019: Proceedings. Institute of Electrical and Electronics Engineers Inc., 2019. 8871814.

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Tajalli, A, Kalousdian, TK, Kretschmar, M, Kleinert, S, Morgner, U & Nagy, T 2019, Characterization of 8 fs deep-UV pulses using XPW dispersion scan. in 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019: Proceedings., 8871814, Institute of Electrical and Electronics Engineers Inc., 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019, Munich, Germany, 23 Jun 2019. https://doi.org/10.1109/CLEOE-EQEC.2019.8871814
Tajalli, A., Kalousdian, T. K., Kretschmar, M., Kleinert, S., Morgner, U., & Nagy, T. (2019). Characterization of 8 fs deep-UV pulses using XPW dispersion scan. In 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019: Proceedings Article 8871814 Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CLEOE-EQEC.2019.8871814
Tajalli A, Kalousdian TK, Kretschmar M, Kleinert S, Morgner U, Nagy T. Characterization of 8 fs deep-UV pulses using XPW dispersion scan. In 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019: Proceedings. Institute of Electrical and Electronics Engineers Inc. 2019. 8871814 doi: 10.1109/CLEOE-EQEC.2019.8871814
Tajalli, Ayhan ; Kalousdian, Thomas K. ; Kretschmar, Martin et al. / Characterization of 8 fs deep-UV pulses using XPW dispersion scan. 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019: Proceedings. Institute of Electrical and Electronics Engineers Inc., 2019.
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@inproceedings{3b030efa262e4e7586194452ad1e3a4d,
title = "Characterization of 8 fs deep-UV pulses using XPW dispersion scan",
abstract = "The measurement of few-fs-long deep-ultraviolet (DUV) pulses is one of the most demanding tasks for optical pulse characterization as these pulses are very much prone to material dispersion and space-time distortions. Therefore, the arrangements should be very carefully designed not to deteriorate the pulses in the course of the measurement. Furthermore, in this wavelength range the most popular nonlinearities used for the characterization such as second harmonic or sum frequency generation processes become unpractical or even unfeasible due to the very limited phase-matching or the even shorter wavelength of the resulted signal. Consequently, up to now most of short UV pulses were characterized by the FROG technique utilizing a degenerate four-wave mixing process, such as self diffraction [1] or transient grating formation [2]. Nevertheless, this technique suffers from rather bad signal to noise ratio and low sensitivity due to wave front splitting necessary for such method.",
author = "Ayhan Tajalli and Kalousdian, {Thomas K.} and Martin Kretschmar and Sven Kleinert and Uwe Morgner and Tamas Nagy",
year = "2019",
month = jun,
doi = "10.1109/CLEOE-EQEC.2019.8871814",
language = "English",
booktitle = "2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
address = "United States",
note = "2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019 ; Conference date: 23-06-2019 Through 27-06-2019",

}

Download

TY - GEN

T1 - Characterization of 8 fs deep-UV pulses using XPW dispersion scan

AU - Tajalli, Ayhan

AU - Kalousdian, Thomas K.

AU - Kretschmar, Martin

AU - Kleinert, Sven

AU - Morgner, Uwe

AU - Nagy, Tamas

PY - 2019/6

Y1 - 2019/6

N2 - The measurement of few-fs-long deep-ultraviolet (DUV) pulses is one of the most demanding tasks for optical pulse characterization as these pulses are very much prone to material dispersion and space-time distortions. Therefore, the arrangements should be very carefully designed not to deteriorate the pulses in the course of the measurement. Furthermore, in this wavelength range the most popular nonlinearities used for the characterization such as second harmonic or sum frequency generation processes become unpractical or even unfeasible due to the very limited phase-matching or the even shorter wavelength of the resulted signal. Consequently, up to now most of short UV pulses were characterized by the FROG technique utilizing a degenerate four-wave mixing process, such as self diffraction [1] or transient grating formation [2]. Nevertheless, this technique suffers from rather bad signal to noise ratio and low sensitivity due to wave front splitting necessary for such method.

AB - The measurement of few-fs-long deep-ultraviolet (DUV) pulses is one of the most demanding tasks for optical pulse characterization as these pulses are very much prone to material dispersion and space-time distortions. Therefore, the arrangements should be very carefully designed not to deteriorate the pulses in the course of the measurement. Furthermore, in this wavelength range the most popular nonlinearities used for the characterization such as second harmonic or sum frequency generation processes become unpractical or even unfeasible due to the very limited phase-matching or the even shorter wavelength of the resulted signal. Consequently, up to now most of short UV pulses were characterized by the FROG technique utilizing a degenerate four-wave mixing process, such as self diffraction [1] or transient grating formation [2]. Nevertheless, this technique suffers from rather bad signal to noise ratio and low sensitivity due to wave front splitting necessary for such method.

UR - http://www.scopus.com/inward/record.url?scp=85074671139&partnerID=8YFLogxK

U2 - 10.1109/CLEOE-EQEC.2019.8871814

DO - 10.1109/CLEOE-EQEC.2019.8871814

M3 - Conference contribution

BT - 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019

Y2 - 23 June 2019 through 27 June 2019

ER -

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