Characteristic-impedance measurement error on lossy substrates

Research output: Contribution to journalArticleResearchpeer review

Authors

  • Dylan F. Williams
  • Uwe Arz
  • Hartmut Grabinski

External Research Organisations

  • Institute of Electrical and Electronics Engineers (IEEE)
  • National Institute of Standards and Technology (NIST)
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Details

Original languageEnglish
Pages (from-to)299-301
Number of pages3
JournalIEEE Microwave and Wireless Components Letters
Volume11
Issue number7
Publication statusPublished - Jul 2001

Abstract

The error caused by parasitic inductance in the characteristic impedance measured by the calibration-comparison method on lossy silicon substrates was examined. The examination showed that the error of the calibration-comparison method due to parasitic inductance was very small. It was indicated that the errors of the calibration-comparison method due to pad inductance and capacitance can be made small with careful designing.

Keywords

    Characteristic impedance, Measurement, Silicon

ASJC Scopus subject areas

Cite this

Characteristic-impedance measurement error on lossy substrates. / Williams, Dylan F.; Arz, Uwe; Grabinski, Hartmut.
In: IEEE Microwave and Wireless Components Letters, Vol. 11, No. 7, 07.2001, p. 299-301.

Research output: Contribution to journalArticleResearchpeer review

Williams DF, Arz U, Grabinski H. Characteristic-impedance measurement error on lossy substrates. IEEE Microwave and Wireless Components Letters. 2001 Jul;11(7):299-301. doi: 10.1109/7260.933777
Williams, Dylan F. ; Arz, Uwe ; Grabinski, Hartmut. / Characteristic-impedance measurement error on lossy substrates. In: IEEE Microwave and Wireless Components Letters. 2001 ; Vol. 11, No. 7. pp. 299-301.
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@article{72e0dd0416a2418b88b881a3b74c11c3,
title = "Characteristic-impedance measurement error on lossy substrates",
abstract = "The error caused by parasitic inductance in the characteristic impedance measured by the calibration-comparison method on lossy silicon substrates was examined. The examination showed that the error of the calibration-comparison method due to parasitic inductance was very small. It was indicated that the errors of the calibration-comparison method due to pad inductance and capacitance can be made small with careful designing.",
keywords = "Characteristic impedance, Measurement, Silicon",
author = "Williams, {Dylan F.} and Uwe Arz and Hartmut Grabinski",
year = "2001",
month = jul,
doi = "10.1109/7260.933777",
language = "English",
volume = "11",
pages = "299--301",
journal = "IEEE Microwave and Wireless Components Letters",
issn = "1531-1309",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "7",

}

Download

TY - JOUR

T1 - Characteristic-impedance measurement error on lossy substrates

AU - Williams, Dylan F.

AU - Arz, Uwe

AU - Grabinski, Hartmut

PY - 2001/7

Y1 - 2001/7

N2 - The error caused by parasitic inductance in the characteristic impedance measured by the calibration-comparison method on lossy silicon substrates was examined. The examination showed that the error of the calibration-comparison method due to parasitic inductance was very small. It was indicated that the errors of the calibration-comparison method due to pad inductance and capacitance can be made small with careful designing.

AB - The error caused by parasitic inductance in the characteristic impedance measured by the calibration-comparison method on lossy silicon substrates was examined. The examination showed that the error of the calibration-comparison method due to parasitic inductance was very small. It was indicated that the errors of the calibration-comparison method due to pad inductance and capacitance can be made small with careful designing.

KW - Characteristic impedance

KW - Measurement

KW - Silicon

UR - http://www.scopus.com/inward/record.url?scp=0035401727&partnerID=8YFLogxK

U2 - 10.1109/7260.933777

DO - 10.1109/7260.933777

M3 - Article

AN - SCOPUS:0035401727

VL - 11

SP - 299

EP - 301

JO - IEEE Microwave and Wireless Components Letters

JF - IEEE Microwave and Wireless Components Letters

SN - 1531-1309

IS - 7

ER -