Chaotic potential on the degenerated semiconductor surface

Research output: Contribution to journalArticleResearchpeer review

Authors

  • Vyacheslav B. Bondarenko
  • Sergey N. Davydov
  • Bernard Nacke
  • Alexey V. Filimonov

External Research Organisations

  • St. Petersburg State Polytechnical University
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Details

Original languageEnglish
Pages (from-to)17-23
Number of pages7
JournalKey Engineering Materials
Volume806
Publication statusPublished - 11 Jun 2019

Abstract

In this paper, natural heterogeneities of the potential on the degenerated semiconductor surface are discussed as well as the barrier height fluctuations in metal-semiconductor contacts. In the case of electroactive dopant linear screening, characteristic values of chaotic potential amplitudes have been defined. The dependence is shown of these heterogeneities on semiconductor electrophysical parameters.

Keywords

    Chaotic potential, Degenerated semiconductor, GaAs, Semiconductor surface

ASJC Scopus subject areas

Cite this

Chaotic potential on the degenerated semiconductor surface. / Bondarenko, Vyacheslav B.; Davydov, Sergey N.; Nacke, Bernard et al.
In: Key Engineering Materials, Vol. 806, 11.06.2019, p. 17-23.

Research output: Contribution to journalArticleResearchpeer review

Bondarenko, VB, Davydov, SN, Nacke, B & Filimonov, AV 2019, 'Chaotic potential on the degenerated semiconductor surface', Key Engineering Materials, vol. 806, pp. 17-23. https://doi.org/10.4028/www.scientific.net/KEM.806.17
Bondarenko, V. B., Davydov, S. N., Nacke, B., & Filimonov, A. V. (2019). Chaotic potential on the degenerated semiconductor surface. Key Engineering Materials, 806, 17-23. https://doi.org/10.4028/www.scientific.net/KEM.806.17
Bondarenko VB, Davydov SN, Nacke B, Filimonov AV. Chaotic potential on the degenerated semiconductor surface. Key Engineering Materials. 2019 Jun 11;806:17-23. doi: 10.4028/www.scientific.net/KEM.806.17
Bondarenko, Vyacheslav B. ; Davydov, Sergey N. ; Nacke, Bernard et al. / Chaotic potential on the degenerated semiconductor surface. In: Key Engineering Materials. 2019 ; Vol. 806. pp. 17-23.
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